Inventor · disambiguated record
Naoyuki Shigyo
Also filed as: SHIGYO NAOYUKI
19 granted patents·2 pending applications·930 citations·filing 1985–2011
96Inventor score
Top patents by PatentIndex Score
21 records- 0198US5698869AInsulated-gate transistor having narrow-bandgap-sourceTOSHIBA KK·Filed 1995·Granted Dec 16, 1997·415 cites·31 claims
- 0294US6051452AMethod for manufacturing a semiconductor device with ion implantationTOSHIBA KK·Filed 1998·Granted Apr 18, 2000·114 cites·4 claims
- 0393US5760442ASemiconductor device of a silicon on insulator metal-insulator type with a concave featureTOSHIBA KK·Filed 1995·Granted Jun 2, 1998·108 cites·14 claims
- 0487US5463234AHigh-speed semiconductor gain memory cell with minimal area occupancyTOSHIBA KK·Filed 1995·Granted Oct 31, 1995·98 cites·16 claims
- 0585US6956747B1Semiconductor deviceTOSHIBA KK·Filed 2005·Granted Oct 18, 2005·14 cites·11 claims
- 0684US8503245B2Non-volatile semiconductor memory device and a programming method thereofYAMADA KUNIHIRO·Filed 2011·Granted Aug 6, 2013·13 cites·8 claims
- 0779US7373627B2Method of designing wiring structure of semiconductor device and wiring structure designed accordinglyTOSHIBA KK·Filed 2005·Granted May 13, 2008·7 cites·9 claims
- 0877US8533549B2Memory system and computer systemKONDO SHIGEO·Filed 2010·Granted Sep 10, 2013·5 cites·18 claims
- 0971US6978434B1Method of designing wiring structure of semiconductor device and wiring structure designed accordinglyTOSHIBA KK·Filed 2000·Granted Dec 20, 2005·13 cites·2 claims
- 1070US8369152B2Semiconductor memory device including charge accumulation layerTOSHIBA KK·Filed 2010·Granted Feb 5, 2013·3 cites·22 claims
- 1170US6222224B1Erasable and programmable nonvolatile semiconductor memory, semiconductor integrated circuit device having the semiconductor memory and method of manufacturing the semiconductor memoryTOSHIBA KK·Filed 1997·Granted Apr 24, 2001·30 cites·22 claims
- 1268US4941114ATriangular mesh generation methodTOSHIBA KK·Filed 1988·Granted Jul 10, 1990·39 cites·13 claims
- 1363US5254867ASemiconductor devices having an improved gateTOSHIBA KK·Filed 1991·Granted Oct 19, 1993·25 cites·10 claims
- 1460US7999324B2Semiconductor device including overcurrent protection elementTOSHIBA KK·Filed 2005·Granted Aug 16, 2011·2 cites·7 claims
- 1560US7823114B2Method of designing wiring structure of semiconductor device and wiring structure designed accordinglyTOSHIBA KK·Filed 2008·Granted Oct 26, 2010·1 cites·3 claims
- 1654US5485028ASemiconductor device having a single crystal semiconductor layer formed on an insulating filmTOSHIBA KK·Filed 1993·Granted Jan 16, 1996·16 cites·4 claims
- 1739US4636824AVoltage-controlled type semiconductor switching deviceIKOMA TOSHIAKI·Filed 1986·Granted Jan 13, 1987·12 cites·15 claims
- 1837US6195790B1Electrical parameter evaluation system, electrical parameter evaluation method, and computer-readable recording medium for recording electrical parameter evaluation programTOSHIBA KK·Filed 1998·Granted Feb 27, 2001·9 cites·19 claims
- 1931US4651411AMethod of manufacturing a MOS device wherein an insulating film is deposited in a field regionTOKYO SHIBAURA ELECTRIC CO·Filed 1985·Granted Mar 24, 1987·6 cites·6 claims
- 2029US2010329026A1Semiconductor memory device with charge accumulation layerNAKAMURA MITSUTOSHI·Filed 2010·Application pending·0 cites
- 2126US2003081363A1ESD protection device and method of manufacturing the deviceFiled 2002·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →