Inventor
RAKSHIT TITASH
US84 patents
⚠️ This page may combine multiple inventors who share the name “RAKSHIT TITASH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
25 patentsUS9812449B2Nov 7, 2017
Multi-VT gate stack for III-V nanosheet devices with reduced parasitic capacitance
SAMSUNG ELECTRONICS CO LTD30 citations94
US10878317B2Dec 29, 2020
Method and system for performing analog complex vector-matrix multiplication
SAMSUNG ELECTRONICS CO LTD13 citations86
US11461620B2Oct 4, 2022
Multi-bit, SoC-compatible neuromorphic weight cell using ferroelectric FETs
SAMSUNG ELECTRONICS CO LTD5 citations84
US10790002B2Sep 29, 2020
Giant spin hall-based compact neuromorphic cell optimized for differential read inference
SAMSUNG ELECTRONICS CO LTD5 citations83
US9960232B2May 1, 2018
Horizontal nanosheet FETs and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD7 citations83
US9685564B2Jun 20, 2017
Gate-all-around field effect transistors with horizontal nanosheet conductive channel structures for MOL/inter-channel spacing and related cell architectures
SAMSUNG ELECTRONICS CO LTD13 citations83
US11983622B2May 14, 2024
High-density neuromorphic computing element
SAMSUNG ELECTRONICS CO LTD1 citations73
US10909449B2Feb 2, 2021
Monolithic multi-bit weight cell for neuromorphic computing
SAMSUNG ELECTRONICS CO LTD3 citations73
US10910313B2Feb 2, 2021
Integrated circuit including field effect transistors having a contact on active gate compatible with a small cell area having a small contacted poly pitch
SAMSUNG ELECTRONICS CO LTD5 citations73
US10679688B2Jun 9, 2020
Ferroelectric-based memory cell usable in on-logic chip memory
SAMSUNG ELECTRONICS CO LTD3 citations73
US10585630B2Mar 10, 2020
Selectorless 3D stackable memory
SAMSUNG ELECTRONICS CO LTD3 citations73
US10026751B2Jul 17, 2018
Semiconductor device including a repeater/buffer at higher metal routing layers and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD4 citations73
US9805795B2Oct 31, 2017
Zero leakage, high noise margin coupled giant spin hall based retention latch
SAMSUNG ELECTRONICS CO LTD2 citations73
US9614002B1Apr 4, 2017
0T bi-directional memory cell
SAMSUNG ELECTRONICS CO LTD2 citations72
US12333422B2Jun 17, 2025
High-density neuromorphic computing element
SAMSUNG ELECTRONICS CO LTD0 citations63
US11586901B2Feb 21, 2023
High-density neuromorphic computing element
SAMSUNG ELECTRONICS CO LTD0 citations63
US12260324B2Mar 25, 2025
Monolithic multi-bit weight cell for neuromorphic computing
SAMSUNG ELECTRONICS CO LTD0 citations62
US11816563B2Nov 14, 2023
Method of enabling sparse neural networks on memresistive accelerators
SAMSUNG ELECTRONICS CO LTD0 citations62
US11769540B2Sep 26, 2023
Giant spin hall-based compact neuromorphic cell optimized for differential read inference
SAMSUNG ELECTRONICS CO LTD0 citations62
US11727258B2Aug 15, 2023
Multi-bit, SoC-compatible neuromorphic weight cell using ferroelectric FETs
SAMSUNG ELECTRONICS CO LTD0 citations62
US11574193B2Feb 7, 2023
Method and system for training of neural networks using continuously differentiable models
SAMSUNG ELECTRONICS CO LTD1 citations62
US11404405B2Aug 2, 2022
Semiconductor device including a repeater/buffer at upper metal routing layers and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US11348629B2May 31, 2022
Giant spin hall-based compact neuromorphic cell optimized for differential read inference
SAMSUNG ELECTRONICS CO LTD0 citations62
US11182686B2Nov 23, 2021
4T4R ternary weight cell with high on/off ratio background
SAMSUNG ELECTRONICS CO LTD0 citations62
US10935743B2Mar 2, 2021
Vertical optical via and method of fabrication
SAMSUNG ELECTRONICS CO LTD0 citations62
INTEL CORP
14 patentsUS7407847B2Aug 5, 2008
Stacked multi-gate transistor design and method of fabrication
INTEL CORP99 citations98
US7759142B1Jul 20, 2010
Quantum well MOSFET channels having uni-axial strain caused by metal source/drains, and conformal regrowth source/drains
INTEL CORP29 citations96
US7838373B2Nov 23, 2010
Replacement spacers for MOSFET fringe capacitance reduction and processes of making same
INTEL CORP52 citations94
US7947971B2May 24, 2011
Quantum well MOSFET channels having uni-axial strain caused by metal source/drains, and conformal regrowth source/drains
INTEL CORP24 citations92
US7700975B2Apr 20, 2010
Schottky barrier metal-germanium contact in metal-germanium-metal photodetectors
INTEL CORP26 citations92
US10084058B2Sep 25, 2018
Quantum well MOSFET channels having lattice mismatch with metal source/drains, and conformal regrowth source/drains
INTEL CORP7 citations84
US9595581B2Mar 14, 2017
Silicon and silicon germanium nanowire structures
INTEL CORP7 citations84
US8022487B2Sep 20, 2011
Increasing body dopant uniformity in multi-gate transistor devices
INTEL CORP11 citations84
US7833889B2Nov 16, 2010
Apparatus and methods for improving multi-gate device performance
INTEL CORP7 citations74
US7763943B2Jul 27, 2010
Reducing external resistance of a multi-gate device by incorporation of a partial metallic fin
INTEL CORP7 citations74
US8362566B2Jan 29, 2013
Stress in trigate devices using complimentary gate fill materials
INTEL CORP4 citations73
US8344425B2Jan 1, 2013
Multi-gate III-V quantum well structures
INTEL CORP5 citations73
US8017933B2Sep 13, 2011
Compositionally-graded quantum-well channels for semiconductor devices
INTEL CORP4 citations63
US7642603B2Jan 5, 2010
Semiconductor device with reduced fringe capacitance
INTEL CORP3 citations63
KUHN KELIN J
2 patentsMAJHI PRASHANT
2 patentsUS8258498B2Sep 4, 2012
Quantum well MOSFET channels having uni-axial strain caused by metal source/drains, and conformal regrowth source/drains
MAJHI PRASHANT15 citations92
US8501508B2Aug 6, 2013
Method of forming quantum well mosfet channels having uni-axial strains caused by metal source/drains
MAJHI PRASHANT7 citations83
PILLARISETTY RAVI
2 patentsRAKSHIT TITASH
1 patentOBRADOVIC BORNA J
1 patentSYNC COMPUTING CORP
1 patentSONY GROUP CORP
1 patentSONY CORP
1 patentShowing the top 50 of 84 patents by PatentIndex Score.