Inventor
TROMP RUDOLF M
US23 patents
⚠️ This page may combine multiple inventors who share the name “TROMP RUDOLF M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
20 patentsUS5316615AMay 31, 1994
Surfactant-enhanced epitaxy
IBM92 citations96
US7525862B1Apr 28, 2009
Methods involving resetting spin-torque magnetic random access memory with domain wall
IBM48 citations92
US5628834AMay 13, 1997
Surfactant-enhanced epitaxy
IBM19 citations92
US5248633ASep 28, 1993
Methods for forming epitaxial self-aligned calcium silicide contacts and structures
IBM24 citations92
US7453062B2Nov 18, 2008
Energy-filtering cathode lens microscopy instrument
IBM10 citations84
US7348566B2Mar 25, 2008
Aberration-correcting cathode lens microscopy instrument
IBM10 citations84
US10755170B2Aug 25, 2020
Resistive processing unit with hysteretic updates for neural network training
IBM5 citations73
US9752865B1Sep 5, 2017
Height measurement using optical interference
IBM2 citations73
US7432514B2Oct 7, 2008
Method and apparatus for surface potential reflection electron mask lithography
IBM8 citations73
US10564056B2Feb 18, 2020
Surface force apparatus based on a spherical lens
IBM1 citations72
US10101224B2Oct 16, 2018
Surface force apparatus based on a spherical lens
IBM2 citations72
US9625331B2Apr 18, 2017
Surface force apparatus based on a spherical lens
IBM3 citations72
US11054320B2Jul 6, 2021
Surface force apparatus based on a spherical lens
IBM0 citations62
US10283315B2May 7, 2019
Measuring spherical and chromatic aberrations in cathode lens electrode microscopes
IBM1 citations62
US10593510B2Mar 17, 2020
Measuring spherical and chromatic aberrations in cathode lens electrode microscopes
IBM0 citations52
US10330458B2Jun 25, 2019
Height measurement using optical interference
IBM0 citations52
US10330457B2Jun 25, 2019
Height measurement using optical interference
IBM0 citations52
US10119801B2Nov 6, 2018
Height measurement using optical interference
IBM0 citations52
US9607804B2Mar 28, 2017
Scanning transmission electron microscope having multiple beams and post-detection image correction
IBM0 citations52
US9552961B2Jan 24, 2017
Scanning transmission electron microscope having multiple beams and post-detection image correction
IBM1 citations52