Inventor

FLEISCHER HANS-JURGEN

DE6 patents

⚠️ This page may combine multiple inventors who share the name “FLEISCHER HANS-JURGEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SUSS MICROTEC TEST SYS GMBH

3 patents

US7733108B2Jun 8, 2010

Method and arrangement for positioning a probe card

SUSS MICROTEC TEST SYS GMBH9 citations82

US7560942B2Jul 14, 2009

Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus

SUSS MICROTEC TEST SYS GMBH2 citations61

US7652491B2Jan 26, 2010

Probe support with shield for the examination of test substrates under use of probe supports

SUSS MICROTEC TEST SYS GMBH4 citations60

TEICH MICHAEL

1 patent

US8692567B2Apr 8, 2014

Method for verifying a test substrate in a prober under defined thermal conditions

TEICH MICHAEL6 citations81

KANEV STOJAN

1 patent

US8278951B2Oct 2, 2012

Probe station for testing semiconductor substrates and comprising EMI shielding

KANEV STOJAN8 citations80

CASCADE MICROTECH INC

1 patent

US9632108B2Apr 25, 2017

Method for verifying a test substrate in a prober under defined thermal conditions

CASCADE MICROTECH INC0 citations51