Inventor
ABT JASON
CA16 patents
⚠️ This page may combine multiple inventors who share the name “ABT JASON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEMICONDUCTOR INSIGHTS INC
12 patentsUS7643665B2Jan 5, 2010
Method of design analysis of existing integrated circuits
SEMICONDUCTOR INSIGHTS INC49 citations96
US7580557B2Aug 25, 2009
Method of design analysis of existing integrated circuits
SEMICONDUCTOR INSIGHTS INC44 citations94
US6907583B2Jun 14, 2005
Computer aided method of circuit extraction
SEMICONDUCTOR INSIGHTS INC24 citations91
US7013028B2Mar 14, 2006
Advanced schematic editor
SEMICONDUCTOR INSIGHTS INC38 citations90
US7693348B2Apr 6, 2010
Method of registering and aligning multiple images
SEMICONDUCTOR INSIGHTS INC26 citations89
US6738957B2May 18, 2004
Schematic organization tool
SEMICONDUCTOR INSIGHTS INC27 citations89
US9534299B2Jan 3, 2017
Method and system for ion beam delayering of a sample and control thereof
SEMICONDUCTOR INSIGHTS INC4 citations82
US7751643B2Jul 6, 2010
Method and apparatus for removing uneven brightness in an image
SEMICONDUCTOR INSIGHTS INC9 citations82
US7765517B2Jul 27, 2010
Method and apparatus for removing dummy features from a data structure
SEMICONDUCTOR INSIGHTS INC6 citations71
US7207018B2Apr 17, 2007
Method and apparatus for locating short circuit faults in an integrated circuit layout
SEMICONDUCTOR INSIGHTS INC2 citations59
US7886258B2Feb 8, 2011
Method and apparatus for removing dummy features from a data structure
SEMICONDUCTOR INSIGHTS INC0 citations50
US7873203B2Jan 18, 2011
Method of design analysis of existing integrated circuits
SEMICONDUCTOR INSIGHTS INC0 citations50
TECHINSIGHTS INC
3 patentsUS11214874B2Jan 4, 2022
Method and system for ion beam delayering of a sample and control thereof
TECHINSIGHTS INC2 citations70
US10689763B2Jun 23, 2020
Method and system for ion beam delayering of a sample and control thereof
TECHINSIGHTS INC0 citations49
US10550480B2Feb 4, 2020
Method and system for ion beam delayering of a sample and control thereof
TECHINSIGHTS INC0 citations49