Inventor
VARADARAJAN DEVANATHAN
US26 patents
Patents
26 patentsUS7277803B2Oct 2, 2007
Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan tests
TEXAS INSTRUMENTS INC11 citations83
US10134483B2Nov 20, 2018
Centralized built-in soft-repair architecture for integrated circuits with embedded memories
TEXAS INSTRUMENTS INC11 citations81
US9852810B2Dec 26, 2017
Optimizing fuseROM usage for memory repair
TEXAS INSTRUMENTS INC8 citations81
US9053799B2Jun 9, 2015
Optimizing fuseROM usage for memory repair
TEXAS INSTRUMENTS INC8 citations81
US10600495B2Mar 24, 2020
Parallel memory self-testing
TEXAS INSTRUMENTS INC8 citations79
US9318222B2Apr 19, 2016
Hierarchical, distributed built-in self-repair solution
TEXAS INSTRUMENTS INC7 citations77
US11436090B2Sep 6, 2022
Non-volatile memory compression for memory repair
TEXAS INSTRUMENTS INC3 citations73
US8051347B2Nov 1, 2011
Scan-enabled method and system for testing a system-on-chip
TEXAS INSTRUMENTS INC8 citations73
US11568951B2Jan 31, 2023
Screening of memory circuits
TEXAS INSTRUMENTS INC2 citations68
US9698779B2Jul 4, 2017
Reconfiguring an ASIC at runtime
TEXAS INSTRUMENTS INC2 citations67
US12525314B2Jan 13, 2026
Built-in memory repair with repair code compression
TEXAS INSTRUMENTS INC0 citations62
US12283332B2Apr 22, 2025
Memory BIST circuit and method
TEXAS INSTRUMENTS INC0 citations62
US12259789B2Mar 25, 2025
Non-volatile memory compression for memory repair
TEXAS INSTRUMENTS INC0 citations62
US12243603B2Mar 4, 2025
At-speed test of functional memory interface logic in devices
TEXAS INSTRUMENTS INC0 citations62
US12147697B2Nov 19, 2024
Methods and apparatus to characterize memory
TEXAS INSTRUMENTS INC0 citations62
US12033711B2Jul 9, 2024
Built-in memory repair with repair code compression
TEXAS INSTRUMENTS INC0 citations62
US12009045B2Jun 11, 2024
Management of multiple memory in-field self-repair options
TEXAS INSTRUMENTS INC0 citations62
US11748202B2Sep 5, 2023
Non-volatile memory compression for memory repair
TEXAS INSTRUMENTS INC0 citations62
US11631472B2Apr 18, 2023
Built-in memory repair with repair code compression
TEXAS INSTRUMENTS INC0 citations62
US11373726B2Jun 28, 2022
Management of multiple memory in-field self-repair options
TEXAS INSTRUMENTS INC1 citations62
US11087857B2Aug 10, 2021
Enabling high at-speed test coverage of functional memory interface logic by selective usage of test paths
TEXAS INSTRUMENTS INC0 citations62
US7555687B2Jun 30, 2009
Sequential scan technique for testing integrated circuits with reduced power, time and/or cost
TEXAS INSTRUMENTS INC3 citations62
US12085610B2Sep 10, 2024
Methods and apparatus to identify faults in processors
TEXAS INSTRUMENTS INC0 citations57
US11881275B2Jan 23, 2024
Screening of memory circuits
TEXAS INSTRUMENTS INC0 citations57
US12217102B2Feb 4, 2025
Distributed mechanism for fine-grained test power control
TEXAS INSTRUMENTS INC0 citations51
US7380184B2May 27, 2008
Sequential scan technique providing enhanced fault coverage in an integrated circuit
TEXAS INSTRUMENTS INC0 citations41