Inventor
MA DAVID SUITWAI
US15 patents
⚠️ This page may combine multiple inventors who share the name “MA DAVID SUITWAI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
14 patentsUS6721180B2Apr 13, 2004
Cooling hood for circuit board
INFINEON TECHNOLOGIES AG65 citations95
US7449909B2Nov 11, 2008
System and method for testing one or more dies on a semiconductor wafer
INFINEON TECHNOLOGIES AG11 citations83
US7277350B2Oct 2, 2007
Implementation of a fusing scheme to allow internal voltage trimming
INFINEON TECHNOLOGIES AG13 citations80
US7242208B2Jul 10, 2007
System and method for testing one or more dies on a semiconductor wafer
INFINEON TECHNOLOGIES AG7 citations72
US6667919B1Dec 23, 2003
Semiconductor memory device and test method thereof using row compression test mode
INFINEON TECHNOLOGIES AG9 citations70
US7643956B2Jan 5, 2010
Continuous self-calibration of internal analog signals
INFINEON TECHNOLOGIES AG3 citations62
US7330040B2Feb 12, 2008
Test circuitry wafer
INFINEON TECHNOLOGIES AG2 citations62
US7177373B2Feb 13, 2007
Continuous self-calibration of internal analog signals
INFINEON TECHNOLOGIES AG2 citations62
US7539075B2May 26, 2009
Implementation of a fusing scheme to allow internal voltage trimming
INFINEON TECHNOLOGIES AG2 citations59
US6903982B2Jun 7, 2005
Bit line segmenting in random access memories
INFINEON TECHNOLOGIES AG4 citations59
US6754113B2Jun 22, 2004
Topography correction for testing of redundant array elements
INFINEON TECHNOLOGIES AG2 citations59
US7305594B2Dec 4, 2007
Integrated circuit in a maximum input/output configuration
INFINEON TECHNOLOGIES AG0 citations50
US6702589B1Mar 9, 2004
Leadless socket for decapped semiconductor device
INFINEON TECHNOLOGIES AG0 citations50
US7071724B2Jul 4, 2006
Wafer probecard interface
INFINEON TECHNOLOGIES AG0 citations41