Inventor

SCHUELER BRUNO

US8 patents

⚠️ This page may combine multiple inventors who share the name “SCHUELER BRUNO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

REVERA INC

4 patents

US7884321B2Feb 8, 2011

Method and system for non-destructive distribution profiling of an element in a film

REVERA INC10 citations91

US7420163B2Sep 2, 2008

Determining layer thickness using photoelectron spectroscopy

REVERA INC21 citations90

US7411188B2Aug 12, 2008

Method and system for non-destructive distribution profiling of an element in a film

REVERA INC24 citations89

US7231324B2Jun 12, 2007

Techniques for analyzing data generated by instruments

REVERA INC8 citations67

DECECCO PAOLA

3 patents

US8269167B2Sep 18, 2012

Method and system for non-destructive distribution profiling of an element in a film

DECECCO PAOLA9 citations81

US9201030B2Dec 1, 2015

Method and system for non-destructive distribution profiling of an element in a film

DECECCO PAOLA2 citations60

US8610059B2Dec 17, 2013

Method and system for non-destructive distribution profiling of an element in a film

DECECCO PAOLA2 citations60

REVARA INC

1 patent

US8916823B2Dec 23, 2014

Method and system for non-destructive distribution profiling of an element in a film

REVARA INC0 citations40