Inventor
ABDEL-HAFEZ KHADER S
US12 patents
⚠️ This page may combine multiple inventors who share the name “ABDEL-HAFEZ KHADER S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNTEST TECHNOLOGIES INC
11 patentsUS7058869B2Jun 6, 2006
Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits
SYNTEST TECHNOLOGIES INC119 citations97
US7412672B1Aug 12, 2008
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC36 citations96
US7032148B2Apr 18, 2006
Mask network design for scan-based integrated circuits
SYNTEST TECHNOLOGIES INC84 citations96
US7444567B2Oct 28, 2008
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
SYNTEST TECHNOLOGIES INC17 citations92
US7231570B2Jun 12, 2007
Method and apparatus for multi-level scan compression
SYNTEST TECHNOLOGIES INC21 citations92
US7552373B2Jun 23, 2009
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC36 citations91
US7512851B2Mar 31, 2009
Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC39 citations91
US7124342B2Oct 17, 2006
Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits
SYNTEST TECHNOLOGIES INC31 citations91
US7590905B2Sep 15, 2009
Method and apparatus for pipelined scan compression
SYNTEST TECHNOLOGIES INC13 citations83
US7210082B1Apr 24, 2007
Method for performing ATPG and fault simulation in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC16 citations83
US7721173B2May 18, 2010
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC3 citations61