Inventor
WANG SHUN-MIIN SAM
US3 patents
Patents
3 patentsUS7032148B2Apr 18, 2006
Mask network design for scan-based integrated circuits
SYNTEST TECHNOLOGIES INC84 citations96
US7512851B2Mar 31, 2009
Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit
SYNTEST TECHNOLOGIES INC39 citations91
US7124342B2Oct 17, 2006
Smart capture for ATPG (automatic test pattern generation) and fault simulation of scan-based integrated circuits
SYNTEST TECHNOLOGIES INC31 citations91