Inventor
RYU JAEWOO
US16 patents
⚠️ This page may combine multiple inventors who share the name “RYU JAEWOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALWAFERS CO LTD
11 patentsUS11739437B2Aug 29, 2023
Resistivity stabilization measurement of fat neck slabs for high resistivity and ultra-high resistivity single crystal silicon ingot growth
GLOBALWAFERS CO LTD2 citations71
US11408090B2Aug 9, 2022
Methods for growing a single crystal silicon ingot using continuous Czochralski method
GLOBALWAFERS CO LTD3 citations71
US11932962B2Mar 19, 2024
Systems and methods for production of silicon using a horizontal magnetic field
GLOBALWAFERS CO LTD0 citations59
US11873574B2Jan 16, 2024
Systems and methods for production of silicon using a horizontal magnetic field
GLOBALWAFERS CO LTD0 citations59
US12031229B2Jul 9, 2024
Ingot puller apparatus having heat shields with feet having an apex
GLOBALWAFERS CO LTD0 citations58
US11873575B2Jan 16, 2024
Ingot puller apparatus having heat shields with voids therein
GLOBALWAFERS CO LTD0 citations58
US11767611B2Sep 26, 2023
Methods for producing a monocrystalline ingot by horizontal magnetic field Czochralski
GLOBALWAFERS CO LTD0 citations58
US12351938B2Jul 8, 2025
Methods for producing a product ingot having low oxygen content
GLOBALWAFERS CO LTD0 citations51
US12486593B2Dec 2, 2025
Axial positioning of magnetic poles while producing a silicon ingot
GLOBALWAFERS CO LTD0 citations48
US12486594B2Dec 2, 2025
Ingot puller apparatus that axially position magnetic poles
GLOBALWAFERS CO LTD0 citations48
US12590383B2Mar 31, 2026
Synthetic crucibles with rim coating
GLOBALWAFERS CO LTD0 citations44
GLOBAL WAFERS CO LTD
4 patentsUS10954606B2Mar 23, 2021
Methods for modeling the impurity concentration of a single crystal silicon ingot
GLOBAL WAFERS CO LTD2 citations71
US10793969B2Oct 6, 2020
Sample rod growth and resistivity measurement during single crystal silicon ingot production
GLOBAL WAFERS CO LTD2 citations69
US10781532B2Sep 22, 2020
Methods for determining the resistivity of a polycrystalline silicon melt
GLOBAL WAFERS CO LTD1 citations59
US11047066B2Jun 29, 2021
Growth of plural sample rods to determine impurity build-up during production of single crystal silicon ingots
GLOBAL WAFERS CO LTD0 citations50