Inventor
JACOBSON STEVEN
US23 patents
⚠️ This page may combine multiple inventors who share the name “JACOBSON STEVEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VENTIS MEDICAL INC
9 patentsUSD1065486SMar 4, 2025
Medical device
VENTIS MEDICAL INC2 citations72
USD1071128SApr 15, 2025
Medical device
VENTIS MEDICAL INC1 citations61
USD1049348SOct 29, 2024
Portion of a medical device
VENTIS MEDICAL INC0 citations59
USD1049350SOct 29, 2024
Portion of a medical device
VENTIS MEDICAL INC0 citations59
USD1049349SOct 29, 2024
Portion of a medical device
VENTIS MEDICAL INC0 citations59
US12080410B2Sep 3, 2024
System and methods of administering a status check to a medical device
VENTIS MEDICAL INC0 citations59
US11742078B2Aug 29, 2023
System and methods of administering a status check to a medical device
VENTIS MEDICAL INC1 citations59
USD1087980SAug 12, 2025
Ventilator display screen with graphical user interface
VENTIS MEDICAL INC0 citations58
USD1087979SAug 12, 2025
Display screen with a graphical user interface
VENTIS MEDICAL INC0 citations58
MCALLISTER CRAIG M
4 patentsUS7985226B2Jul 26, 2011
Distal femoral cutting guide
MCALLISTER CRAIG M17 citations90
US7748984B2Jul 6, 2010
Apparatus and method for instruction in orthopedic surgery
MCALLISTER CRAIG M21 citations90
US8814880B2Aug 26, 2014
Device and method for mounting an object on a bone
MCALLISTER CRAIG M11 citations82
US8529573B2Sep 10, 2013
Distal femoral cutting guide
MCALLISTER CRAIG M3 citations60
NAT SEMICONDUCTOR CORP
4 patentsUS7659742B1Feb 9, 2010
Vacuum chamber AC/DC probe
NAT SEMICONDUCTOR CORP10 citations76
US6937351B1Aug 30, 2005
Non-destructive method of measuring the thickness of a semiconductor wafer
NAT SEMICONDUCTOR CORP8 citations71
US7848562B1Dec 7, 2010
Method of reducing the time required to perform a passive voltage contrast test
NAT SEMICONDUCTOR CORP4 citations57
US7436197B1Oct 14, 2008
Virtual test head for IC
NAT SEMICONDUCTOR CORP0 citations52