Inventor
MUN SEONG YEOL
US31 patents
⚠️ This page may combine multiple inventors who share the name “MUN SEONG YEOL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OMNIVISION TECH INC
25 patentsUS10811453B1Oct 20, 2020
Pillar structures for suppressing optical cross-talk
OMNIVISION TECH INC36 citations93
US11189655B1Nov 30, 2021
Isolation structure for suppressing floating diffusion junction leakage in CMOS image sensor
OMNIVISION TECH INC12 citations85
US11348957B2May 31, 2022
Transistor having increased effective channel width
OMNIVISION TECH INC3 citations73
US11984464B2May 14, 2024
CMOS image sensor having front side and back side trench isolation structures enclosing pixel regions and a capacitor for storing the image charge
OMNIVISION TECH INC2 citations72
US11695030B2Jul 4, 2023
Reduced cross-talk pixel-array substrate and fabrication method
OMNIVISION TECH INC2 citations72
US11647300B2May 9, 2023
Method for forming LED flickering reduction (LFR) film for HDR image sensor and image sensor having same
OMNIVISION TECH INC3 citations72
US11626433B2Apr 11, 2023
Transistors having increased effective channel width
OMNIVISION TECH INC2 citations72
US11616088B2Mar 28, 2023
Transistors having increased effective channel width
OMNIVISION TECH INC2 citations72
US11444108B2Sep 13, 2022
Isolation structure for suppression floating diffusion junction leakage in CMOS image sensor
OMNIVISION TECH INC5 citations72
US12262562B2Mar 25, 2025
Image sensor with varying depth deep trench isolation structure for reduced crosstalk
OMNIVISION TECH INC1 citations63
US12087792B2Sep 10, 2024
Suppressed cross-talk pixel-array substrate and fabrication method
OMNIVISION TECH INC0 citations62
US11901383B2Feb 13, 2024
Transistor having increased effective channel width
OMNIVISION TECH INC0 citations62
US11810928B2Nov 7, 2023
CMOS image sensor with LED flickering reduction and low color cross-talk
OMNIVISION TECH INC0 citations62
US11705475B2Jul 18, 2023
Method of forming shallow trench isolation (STI) structure for suppressing dark current
OMNIVISION TECH INC0 citations62
US11557620B2Jan 17, 2023
Metal grid structure integrated with deep trench isolation structure
OMNIVISION TECH INC1 citations62
US11527569B2Dec 13, 2022
High dynamic range split pixel CMOS image sensor with low color crosstalk
OMNIVISION TECH INC1 citations62
US11282890B2Mar 22, 2022
Shallow trench isolation (STI) structure for suppressing dark current and method of forming
OMNIVISION TECH INC0 citations62
US12107107B2Oct 1, 2024
Dark-current inhibiting image sensor and method
OMNIVISION TECH INC0 citations60
US11876110B2Jan 16, 2024
SiGe photodiode for crosstalk reduction
OMNIVISION TECH INC0 citations51
US11869906B2Jan 9, 2024
Image sensor with elevated floating diffusion
OMNIVISION TECH INC0 citations51
US11862509B2Jan 2, 2024
Shallow trench isolation (STI) structure for CMOS image sensor
OMNIVISION TECH INC0 citations51
US11700464B2Jul 11, 2023
Selective nitrided gate-oxide for RTS noise and white-pixel reduction
OMNIVISION TECH INC0 citations51
US11289530B2Mar 29, 2022
Shallow trench isolation (STI) structure for CMOS image sensor
OMNIVISION TECH INC0 citations51
US11264419B2Mar 1, 2022
Image sensor with fully depleted silicon on insulator substrate
OMNIVISION TECH INC0 citations51
US11217613B2Jan 4, 2022
Image sensor with split pixel structure and method of manufacturing thereof
OMNIVISION TECH INC0 citations51
GLOBALFOUNDRIES INC
4 patentsUS9570586B2Feb 14, 2017
Fabrication methods facilitating integration of different device architectures
GLOBALFOUNDRIES INC4 citations73
US10510662B2Dec 17, 2019
Vertically oriented metal silicide containing e-fuse device and methods of making same
GLOBALFOUNDRIES INC1 citations62
US10297672B2May 21, 2019
Triple gate technology for 14 nanometer and onwards
GLOBALFOUNDRIES INC1 citations59
US10879171B2Dec 29, 2020
Vertically oriented metal silicide containing e-fuse device
GLOBALFOUNDRIES INC0 citations52