Inventor
VAN HORN JODY J
US9 patents
⚠️ This page may combine multiple inventors who share the name “VAN HORN JODY J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
8 patentsUS5600257AFeb 4, 1997
Semiconductor wafer test and burn-in
IBM196 citations97
US6618682B2Sep 9, 2003
Method for test optimization using historical and actual fabrication test data
IBM88 citations95
US7298161B2Nov 20, 2007
Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability
IBM10 citations83
US9535113B1Jan 3, 2017
Diversified exerciser and accelerator
IBM2 citations66
US7000162B2Feb 14, 2006
Integrated circuit phase partitioned power distribution for stress power reduction
IBM5 citations62
US6891359B2May 10, 2005
Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability
IBM1 citations51
US6763314B2Jul 13, 2004
AC defect detection and failure avoidance power up and diagnostic system
IBM0 citations51
US7265561B2Sep 4, 2007
Device burn in utilizing voltage control
IBM1 citations49