P

Inventor

HATAHORI TAKAHIDE

JP22 patents
⚠️ This page may combine multiple inventors who share the name “HATAHORI TAKAHIDE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHIMADZU CORP

21 patents
US10267618B2Apr 23, 2019

Defect detection method and defect detection apparatus

SHIMADZU CORP7 citations83
US11226294B2Jan 18, 2022

Defect inspection apparatus

SHIMADZU CORP2 citations72
US11193887B2Dec 7, 2021

Defect detection method and device

SHIMADZU CORP2 citations72
US11181510B2Nov 23, 2021

Inspection apparatus and inspection method

SHIMADZU CORP2 citations72
US10317190B2Jun 11, 2019

Vibration measurement device

SHIMADZU CORP2 citations72
US11982641B2May 14, 2024

Method and device for examining clinched portion of tubular body

SHIMADZU CORP0 citations62
US10942152B2Mar 9, 2021

Defect inspection device and method

SHIMADZU CORP1 citations62
US10429172B2Oct 1, 2019

Defect detection method and defect detection device

SHIMADZU CORP1 citations62
US11977032B2May 7, 2024

Displacement measurement device and defect detection device

SHIMADZU CORP0 citations61
US12596105B2Apr 7, 2026

Defect inspection apparatus and defect inspection method

SHIMADZU CORP0 citations51
US12360052B2Jul 15, 2025

Defect inspection apparatus and defect inspection method

SHIMADZU CORP0 citations51
US12188769B2Jan 7, 2025

Defect inspection device and defect inspection method

SHIMADZU CORP0 citations51
US12111266B2Oct 8, 2024

Vibration measurement device

SHIMADZU CORP0 citations51
US11815493B2Nov 14, 2023

Defect inspection apparatus and defect inspection method

SHIMADZU CORP0 citations51
US11790513B2Oct 17, 2023

Defect inspection apparatus and defect inspection method

SHIMADZU CORP0 citations51
US11774746B2Oct 3, 2023

Interference image imaging apparatus

SHIMADZU CORP0 citations51
US11391700B2Jul 19, 2022

Defect detection device

SHIMADZU CORP0 citations51
US9551617B2Jan 24, 2017

Raman spectroscopic analyzer

SHIMADZU CORP0 citations51
US12482086B2Nov 25, 2025

Defect inspection apparatus

SHIMADZU CORP0 citations50
US12099000B2Sep 24, 2024

Defect detection device and defect detection method

SHIMADZU CORP0 citations50
US10288550B2May 14, 2019

Flow cell

SHIMADZU CORP0 citations40

KOBE STEEL LTD

1 patent