Inventor
NAGANO SHIGENORI
JP15 patents
⚠️ This page may combine multiple inventors who share the name “NAGANO SHIGENORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
13 patentsUS6166818ADec 26, 2000
Interference measurement apparatus, interference measurement probe and interference measurement control system
TOPCON CORP8 citations73
US6075600AJun 13, 2000
Signal formation apparatus for use in interference measurement
TOPCON CORP14 citations73
US11754516B2Sep 12, 2023
Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method
TOPCON CORP2 citations70
US11614415B2Mar 28, 2023
Nondestructive testing system and nondestructive testing method
TOPCON CORP5 citations70
US11513084B2Nov 29, 2022
Nondestructive inspecting system, and nondestructive inspecting method
TOPCON CORP4 citations69
US7309168B2Dec 18, 2007
Optical fiber cable
TOPCON CORP5 citations60
US11747288B2Sep 5, 2023
Non-destructive inspection system comprising neutron radiation source and neutron radiation method
TOPCON CORP0 citations59
US5349431ASep 20, 1994
Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide
TOPCON CORP2 citations58
US12366542B2Jul 22, 2025
Nondestructive inspection system
TOPCON CORP0 citations57
US6233370B1May 15, 2001
Interference measurement apparatus and probe used for interference measurement apparatus
TOPCON CORP1 citations51
US5337169AAug 9, 1994
Method for patterning an optical device for optical IC, and an optical device for optical IC fabricated by this method
TOPCON CORP0 citations50
US12467889B2Nov 11, 2025
Non-destructive inspection device and non- destructive inspection system
TOPCON CORP0 citations46
US7561768B2Jul 14, 2009
Optical branching device
TOPCON CORP0 citations38