Inventor
AIKOH Hanako
JP3 patents
Patents
3 patentsUS11513084B2Nov 29, 2022
Nondestructive inspecting system, and nondestructive inspecting method
TOPCON CORP4 citations69
US12366542B2Jul 22, 2025
Nondestructive inspection system
TOPCON CORP0 citations57
US12467889B2Nov 11, 2025
Non-destructive inspection device and non- destructive inspection system
TOPCON CORP0 citations46