Inventor
ROBERTS GORDON D
US29 patents
Patents
29 patentsUS6947341B2Sep 20, 2005
Integrated semiconductor memory chip with presence detect data capability
MICRON TECHNOLOGY INC74 citations98
US5677567AOct 14, 1997
Leads between chips assembly
MICRON TECHNOLOGY INC93 citations97
US6028799AFeb 22, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC17 citations96
US6008533ADec 28, 1999
Controlling impedances of an integrated circuit
MICRON TECHNOLOGY INC53 citations96
US5894165AApr 13, 1999
Leads between chips assembly
MICRON TECHNOLOGY INC45 citations96
US5770480AJun 23, 1998
Method of leads between chips assembly
MICRON TECHNOLOGY INC35 citations96
US6625692B1Sep 23, 2003
Integrated semiconductor memory chip with presence detect data capability
MICRON TECHNOLOGY INC20 citations92
US5923672AJul 13, 1999
Multipath antifuse circuit
MICRON TECHNOLOGY INC27 citations92
US6232148B1May 15, 2001
Method and apparatus leads-between-chips
MICRON TECHNOLOGY INC31 citations90
US5877993AMar 2, 1999
Memory circuit voltage regulator
MICRON TECHNOLOGY INC16 citations86
US6778452B2Aug 17, 2004
Circuit and method for voltage regulation in a semiconductor device
MICRON TECHNOLOGY INC6 citations82
US6052322AApr 18, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC6 citations82
US6011731AJan 4, 2000
Cell plate regulator
MICRON TECHNOLOGY INC7 citations82
US7152143B2Dec 19, 2006
Integrated semiconductor memory chip with presence detect data capability
MICRON TECHNOLOGY INC6 citations74
US6181617B1Jan 30, 2001
Method and apparatus for testing a semiconductor device
MICRON TECHNOLOGY INC2 citations74
US5982687ANov 9, 1999
Method of detecting leakage within a memory cell capacitor
MICRON TECHNOLOGY INC3 citations74
US5976911ANov 2, 1999
Controlling impedances of an integrated circuit
MICRON TECHNOLOGY INC9 citations74
US6882587B2Apr 19, 2005
Method of preparing to test a capacitor
MICRON TECHNOLOGY INC0 citations63
US6600687B2Jul 29, 2003
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6469944B2Oct 22, 2002
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6445629B2Sep 3, 2002
Method of stressing a memory device
MICRON TECHNOLOGY INC0 citations63
US6418071B2Jul 9, 2002
Method of testing a memory cell
MICRON TECHNOLOGY INC0 citations63
US6353564B1Mar 5, 2002
Method of testing a memory array
MICRON TECHNOLOGY INC0 citations63
US6226210B1May 1, 2001
Method of detecting a short from a digit line pair to ground
MICRON TECHNOLOGY INC0 citations63
US6198676B1Mar 6, 2001
Test device
MICRON TECHNOLOGY INC0 citations63
US6188622B1Feb 13, 2001
Method of identifying a defect within a memory circuit
MICRON TECHNOLOGY INC1 citations63
US6026040AFeb 15, 2000
Method of altering the margin affecting a memory cell
MICRON TECHNOLOGY INC1 citations63
US6235622B1May 22, 2001
Method and apparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connected to the substrate after manufacture
MICRON TECHNOLOGY INC0 citations51
US6137119AOct 24, 2000
Apparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connecting the conductive region to the substrate after manufacture
MICRON TECHNOLOGY INC0 citations51