Inventor
HAMADA MORIHIKO
JP3 patents
Patents
3 patentsUS7171592B2Jan 30, 2007
Self-testing circuit in semiconductor memory device
FUJITSU LTD13 citations79
US6765401B2Jul 20, 2004
Semiconductor testing apparatus for conducting conduction tests
FUJITSU LTD16 citations78
US7256591B2Aug 14, 2007
Probe card, having cantilever-type probe and method
FUJITSU LTD5 citations57