Inventor

JANIK GARY

US21 patents

⚠️ This page may combine multiple inventors who share the name “JANIK GARY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JANIK GARY

KLA TENCOR TECH CORP

Optical system for measuring samples using short wavelength radiation

Systems and methods for measurement or analysis of a specimen using separated spectral peaks in light

Systems and methods for measurement of a specimen with vacuum ultraviolet light

Method and apparatus for improved x-ray reflection measurement

Systems and methods for measurement of a specimen with vacuum ultraviolet light

Systems and methods for measuring stress in a specimen

Methods and apparatus for characterizing thin films

Systems and methods for measurement of a specimen with vacuum ultraviolet light

Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis

Surface photo-acoustic film measurement device and technique

Systems and methods for measurement of a specimen with vacuum ultraviolet light

Time-resolved measurement technique using radiation pulses

KLA TENCOR CORP

System and method for apodization in a semiconductor device inspection system

System and method for apodization in a semiconductor device inspection system

Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis

System and method for rejuvenating an imaging sensor degraded by exposure to extreme ultraviolet or deep ultraviolet light

SANDISK TECHNOLOGIES LLC

Systems and methods for managing storage endurance

Configuration parameter management for non-volatile data storage

Systems and methods for managing storage endurance

SANDISK TECHNOLOGIES INC

Configuration parameter management for non-volatile data storage

BENDER DAVID L

Crucible weight measurement system for controlling feedstock introduction in Czochralski crystal growth