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Inventor
ILIC BOJAN R
US
2 patents
Patents
2 patents
US8893310B2
Nov 18, 2014
Scanned probe microscopy (SPM) probe having angled tip
REUTER MARK C
0 citations
43
US8539611B1
Sep 17, 2013
Scanned probe microscopy (SPM) probe having angled tip
REUTER MARK C
1 citations
43