Inventor
HONG DUCK HWA
KR19 patents
⚠️ This page may combine multiple inventors who share the name “HONG DUCK HWA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SK HYNIX INC
13 patentsUS9311984B1Apr 12, 2016
Smart refresh device
SK HYNIX INC42 citations93
US11651812B2May 16, 2023
Semiconductor memory device for performing target refresh operation and hidden refresh operation in response to normal refresh command and determining row hammer risk level
SK HYNIX INC2 citations73
US10614873B2Apr 7, 2020
Memory device, memory system including the same, and address counting and comparing operation for refresh operation method thereof
SK HYNIX INC2 citations73
US11646072B2May 9, 2023
Electronic device for adjusting refresh operation period
SK HYNIX INC0 citations61
US9373379B2Jun 21, 2016
Active control device and semiconductor device including the same
SK HYNIX INC2 citations61
US12494233B2Dec 9, 2025
Semiconductor device and operating method of semiconductor device
SK HYNIX INC0 citations60
US12400701B2Aug 26, 2025
Memory device for performing smart refresh operation and method of reducing power consumption during refresh
SK HYNIX INC0 citations58
US11881246B2Jan 23, 2024
Memory device for performing smart refresh operation and memory system including the same
SK HYNIX INC0 citations58
US12400696B2Aug 26, 2025
Memory device performing precharge operation, and operating method thereof
SK HYNIX INC0 citations55
US12198747B2Jan 14, 2025
Memory including row circuit and operation method thereof
SK HYNIX INC0 citations55
US9336844B2May 10, 2016
Semiconductor device
SK HYNIX INC0 citations52
US10110228B2Oct 23, 2018
Semiconductor device
SK HYNIX INC0 citations51
US9396773B2Jul 19, 2016
Semiconductor device
SK HYNIX INC0 citations39
HYNIX SEMICONDUCTOR INC
3 patentsUS7368300B2May 6, 2008
Capacitor in semiconductor device and method for fabricating the same
HYNIX SEMICONDUCTOR INC2 citations61
US7990788B2Aug 2, 2011
Refresh characteristic testing circuit and method for testing refresh using the same
HYNIX SEMICONDUCTOR INC2 citations58
US8036054B2Oct 11, 2011
Semiconductor memory device with improved sensing margin
HYNIX SEMICONDUCTOR INC0 citations51