Inventor
KOMODA MICHIO
JP22 patents
⚠️ This page may combine multiple inventors who share the name “KOMODA MICHIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
15 patentsUS5473548ADec 5, 1995
Apparatus for computing power consumption of MOS transistor logic function block
MITSUBISHI ELECTRIC CORP26 citations91
US6510404B1Jan 21, 2003
Gate delay calculation apparatus and method thereof using parameter expressing RC model source resistance value
MITSUBISHI ELECTRIC CORP14 citations83
US5444647AAug 22, 1995
Multiplier circuit and division circuit with a round-off function
MITSUBISHI ELECTRIC CORP16 citations82
US6678849B1Jan 13, 2004
Semiconductor integrated circuit and test pattern generation method therefor
MITSUBISHI ELECTRIC CORP9 citations73
US6073265AJun 6, 2000
Pipeline circuit with a test circuit with small circuit scale and an automatic test pattern generating method for testing the same
MITSUBISHI ELECTRIC CORP10 citations73
US5438524AAug 1, 1995
Logic synthesizer
MITSUBISHI ELECTRIC CORP18 citations73
US5379232AJan 3, 1995
Logic simulator
MITSUBISHI ELECTRIC CORP13 citations73
US5541861AJul 30, 1996
Logic simulator
MITSUBISHI ELECTRIC CORP10 citations72
US5515291AMay 7, 1996
Apparatus for calculating delay time in logic functional blocks
MITSUBISHI ELECTRIC CORP17 citations72
US5729126AMar 17, 1998
Master slice LSI with integrated fault detection circuitry
MITSUBISHI ELECTRIC CORP2 citations63
US6546537B1Apr 8, 2003
Wiring data generation method and wiring data generation apparatus allowing inconsistency between block internal line and block external lines
MITSUBISHI ELECTRIC CORP6 citations62
US6292043B1Sep 18, 2001
Semiconductor integrated circuit device
MITSUBISHI ELECTRIC CORP2 citations62
US6076178AJun 13, 2000
Test circuit and method for DC testing LSI capable of preventing simultaneous change of signals
MITSUBISHI ELECTRIC CORP3 citations62
US5619440AApr 8, 1997
Multiplier circuit with rounding-off function
MITSUBISHI ELECTRIC CORP3 citations62
US6552551B2Apr 22, 2003
Method of producing load for delay time calculation and recording medium
MITSUBISHI ELECTRIC CORP2 citations58
RENESAS TECH CORP
5 patentsUS6925624B2Aug 2, 2005
Circuit modification method
RENESAS TECH CORP12 citations84
US7479825B2Jan 20, 2009
Clock forming method for semiconductor integrated circuit and program product for the method
RENESAS TECH CORP4 citations62
US7127385B2Oct 24, 2006
Delay time estimation method and recording medium storing estimation program
RENESAS TECH CORP6 citations62
US7039573B2May 2, 2006
Method of formulating load model for glitch analysis and recording medium with the method recorded thereon
RENESAS TECH CORP2 citations62
US7496491B2Feb 24, 2009
Delay calculation method capable of calculating delay time with small margin of error
RENESAS TECH CORP0 citations41