Inventor
ACHER OLIVIER
FR19 patents
⚠️ This page may combine multiple inventors who share the name “ACHER OLIVIER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
COMMISSARIAT ENERGIE ATOMIQUE
9 patentsUS7306388B2Dec 11, 2007
Peripheral which can be used to print and cut sheets of paper using a low-power laser source
COMMISSARIAT ENERGIE ATOMIQUE13 citations83
US6759985B2Jul 6, 2004
Anisotropic composite antenna
COMMISSARIAT ENERGIE ATOMIQUE17 citations77
US6708880B1Mar 23, 2004
System and method for authenticating manufactured articles provided with magnetic marking and method for marking such articles
COMMISSARIAT ENERGIE ATOMIQUE7 citations69
US6677762B1Jan 13, 2004
Method for determining the permeability of a magnetic material by coaxial line perturbation
COMMISSARIAT ENERGIE ATOMIQUE9 citations65
US5691645ANov 25, 1997
Process for determining intrinsic magnetic permeability of elongated ferromagnetic elements and electromagnetic properties of composites using such elements
COMMISSARIAT ENERGIE ATOMIQUE3 citations55
US7071876B2Jul 4, 2006
High impedance substrate
COMMISSARIAT ENERGIE ATOMIQUE3 citations53
US7254963B2Aug 14, 2007
Method and device for continuous production of glass-sheathed metal wires
COMMISSARIAT ENERGIE ATOMIQUE6 citations51
US7369025B2May 6, 2008
Electronic device provided with a magnetic screening
COMMISSARIAT ENERGIE ATOMIQUE0 citations42
US7919961B2Apr 5, 2011
Method for measuring magnetic permeability and reference sample used in the latter
COMMISSARIAT ENERGIE ATOMIQUE0 citations34
HORIBA JOBIN YVON SAS
5 patentsUS9709441B2Jul 18, 2017
Spectrometer of high diffraction efficiency for analyzing the spectrum of a light beam
HORIBA JOBIN YVON SAS3 citations72
US10073038B2Sep 11, 2018
Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sample
HORIBA JOBIN YVON SAS2 citations68
US9736389B2Aug 15, 2017
Device and method for characterizing a sample using localized measurements
HORIBA JOBIN YVON SAS3 citations67
US9551618B2Jan 24, 2017
Wavefront-division polarimetric analysis method and device, spectropolarimeter, polarimetric camera and optical microscope using such a device
HORIBA JOBIN YVON SAS2 citations67
US9638635B2May 2, 2017
Spectrometer for analysing the spectrum of a light beam
HORIBA JOBIN YVON SAS1 citations43