Inventor
YOSHIMI MAKOTO
JP19 patents
⚠️ This page may combine multiple inventors who share the name “YOSHIMI MAKOTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
14 patentsUS5886385AMar 23, 1999
Semiconductor device and manufacturing method thereof
TOSHIBA KK341 citations98
US5844278ADec 1, 1998
Semiconductor device having a projecting element region
TOSHIBA KK170 citations98
US5698869ADec 16, 1997
Insulated-gate transistor having narrow-bandgap-source
TOSHIBA KK415 citations98
US5100810AMar 31, 1992
Manufacturing method of semiconductor devices
TOSHIBA KK73 citations96
US5463234AOct 31, 1995
High-speed semiconductor gain memory cell with minimal area occupancy
TOSHIBA KK98 citations95
US5097311AMar 17, 1992
Semiconductor device
TOSHIBA KK69 citations94
US6130461AOct 10, 2000
Semiconductor memory device
TOSHIBA KK18 citations92
US5734181AMar 31, 1998
Semiconductor device and manufacturing method therefor
TOSHIBA KK53 citations92
US6342408B1Jan 29, 2002
Method of manufacturing semiconductor memory device
TOSHIBA KK12 citations82
US5895956AApr 20, 1999
Semiconductor memory device
TOSHIBA KK14 citations82
US6545323B2Apr 8, 2003
Semiconductor memory device including a pair of MOS transistors forming a detection circuit
TOSHIBA KK9 citations74
US5485028AJan 16, 1996
Semiconductor device having a single crystal semiconductor layer formed on an insulating film
TOSHIBA KK16 citations74
US6376897B2Apr 23, 2002
Lateral bipolar transistor formed on an insulating layer
TOSHIBA KK13 citations73
US6174779B1Jan 16, 2001
Method for manufacturing a lateral bipolar transistor
TOSHIBA KK7 citations72
FUJITSU LTD
3 patentsUS7894439B2Feb 22, 2011
Communication device in a virtual private network using a multi protocol label switch
FUJITSU LTD4 citations62
US9191143B2Nov 17, 2015
Optical transmission device and optical transmission device control method
FUJITSU LTD2 citations58
US9838113B2Dec 5, 2017
Optical wavelength multiplexing device, optical transmission device, and abnormality determination method
FUJITSU LTD1 citations42