Inventor
HUANG TIAO-YUAN
TW35 patents
⚠️ This page may combine multiple inventors who share the name “HUANG TIAO-YUAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VLSI TECHNOLOGY INC
12 patentsUS5814544ASep 29, 1998
Forming a MOS transistor with a recessed channel
VLSI TECHNOLOGY INC59 citations96
US5618740AApr 8, 1997
Method of making CMOS output buffer with enhanced ESD resistance
VLSI TECHNOLOGY INC36 citations92
US5529941AJun 25, 1996
Method for making an integrated circuit structure
VLSI TECHNOLOGY INC22 citations92
US5517049AMay 14, 1996
CMOS output buffer with enhanced ESD resistance
VLSI TECHNOLOGY INC36 citations92
US5418391AMay 23, 1995
Semiconductor-on-insulator integrated circuit with selectively thinned channel region
VLSI TECHNOLOGY INC20 citations92
US5413969AMay 9, 1995
Differential treatment to selectively avoid silicide formation on ESD I/O transistors in a salicide process
VLSI TECHNOLOGY INC26 citations92
US5394358AFeb 28, 1995
SRAM memory cell with tri-level local interconnect
VLSI TECHNOLOGY INC33 citations92
US5342798AAug 30, 1994
Method for selective salicidation of source/drain regions of a transistor
VLSI TECHNOLOGY INC23 citations92
US5581105ADec 3, 1996
CMOS input buffer with NMOS gate coupled to VSS through undoped gate poly resistor
VLSI TECHNOLOGY INC13 citations74
US5510728AApr 23, 1996
Multi-finger input buffer with transistor gates capacitively coupled to ground
VLSI TECHNOLOGY INC14 citations74
US5386134AJan 31, 1995
Asymmetric electro-static discharge transistors for increased electro-static discharge hardness
VLSI TECHNOLOGY INC13 citations74
US5716860AFeb 10, 1998
CMOS input buffer with NMOS gate coupled to Vss through undoped gate poly resistor
VLSI TECHNOLOGY INC3 citations63
XEROX CORP
8 patentsUS4907048AMar 6, 1990
Double implanted LDD transistor self-aligned with gate
XEROX CORP168 citations99
US4963504AOct 16, 1990
Method for fabricating double implanted LDD transistor self-aligned with gate
XEROX CORP115 citations96
US4904611AFeb 27, 1990
Formation of large grain polycrystalline films
XEROX CORP63 citations96
US4988638AJan 29, 1991
Method of fabrication a thin film SOI CMOS device
XEROX CORP40 citations92
US4951113AAug 21, 1990
Simultaneously deposited thin film CMOS TFTs and their method of fabrication
XEROX CORP48 citations92
US4945067AJul 31, 1990
Intra-gate offset high voltage thin film transistor with misalignment immunity and method of its fabrication
XEROX CORP32 citations92
US4907041AMar 6, 1990
Intra-gate offset high voltage thin film transistor with misalignment immunity
XEROX CORP26 citations92
US5038184AAug 6, 1991
Thin film varactors
XEROX CORP27 citations90
NAT SCIENCE COUNCIL
7 patentsUS5893741AApr 13, 1999
Method for simultaneously forming local interconnect with silicided elevated source/drain MOSFET's
NAT SCIENCE COUNCIL428 citations99
US5783479AJul 21, 1998
Structure and method for manufacturing improved FETs having T-shaped gates
NAT SCIENCE COUNCIL103 citations98
US6087189AJul 11, 2000
Test structure for monitoring overetching of silicide during contact opening
NAT SCIENCE COUNCIL46 citations92
US5827768AOct 27, 1998
Method for manufacturing an MOS transistor having a self-aligned and planarized raised source/drain structure
NAT SCIENCE COUNCIL25 citations92
US6432786B2Aug 13, 2002
Method of forming a gate oxide layer with an improved ability to resist the process damage
NAT SCIENCE COUNCIL16 citations84
US6495432B2Dec 17, 2002
Method of improving a dual gate CMOS transistor to resist the boron-penetrating effect
NAT SCIENCE COUNCIL2 citations63
US6232206B1May 15, 2001
Method for forming electrostatic discharge (ESD) protection transistors
NAT SCIENCE COUNCIL1 citations52