Inventor
LIN JASON Z
US24 patents
⚠️ This page may combine multiple inventors who share the name “LIN JASON Z”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
10 patentsUS6137570AOct 24, 2000
System and method for analyzing topological features on a surface
KLA TENCOR CORP161 citations99
US7555409B1Jun 30, 2009
Daisy chained topology
KLA TENCOR CORP48 citations92
US7440607B1Oct 21, 2008
Outlier substrate inspection
KLA TENCOR CORP45 citations89
US8000922B2Aug 16, 2011
Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm
KLA TENCOR CORP16 citations82
US7440640B1Oct 21, 2008
Image data storage
KLA TENCOR CORP8 citations73
US7865037B1Jan 4, 2011
Memory load balancing
KLA TENCOR CORP2 citations62
US7602958B1Oct 13, 2009
Mirror node process verification
KLA TENCOR CORP5 citations62
US7379838B2May 27, 2008
Programmable image computer
KLA TENCOR CORP2 citations62
US11295438B2Apr 5, 2022
Method and system for mixed mode wafer inspection
KLA TENCOR CORP0 citations61
US10192303B2Jan 29, 2019
Method and system for mixed mode wafer inspection
KLA TENCOR CORP0 citations51
KLA TENCOR TECH CORP
7 patentsUS7570800B2Aug 4, 2009
Methods and systems for binning defects detected on a specimen
KLA TENCOR TECH CORP29 citations90
US7024339B1Apr 4, 2006
Full swath analysis
KLA TENCOR TECH CORP12 citations83
US7251586B2Jul 31, 2007
Full swath analysis
KLA TENCOR TECH CORP6 citations73
US7181368B1Feb 20, 2007
Status polling
KLA TENCOR TECH CORP9 citations73
US7149642B1Dec 12, 2006
Programmable image computer
KLA TENCOR TECH CORP7 citations73
US7218768B2May 15, 2007
Inspection method and apparatus for the inspection of either random or repeating patterns
KLA TENCOR TECH CORP4 citations71
US7076390B1Jul 11, 2006
Memory load balancing
KLA TENCOR TECH CORP5 citations62