Inventor
HEIDEL DAVID F
US8 patents
⚠️ This page may combine multiple inventors who share the name “HEIDEL DAVID F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
6 patentsUS6230290B1May 8, 2001
Method of self programmed built in self test
IBM54 citations95
US6108798AAug 22, 2000
Self programmed built in self test
IBM30 citations92
US7084660B1Aug 1, 2006
System and method for accelerated detection of transient particle induced soft error rates in integrated circuits
IBM32 citations89
US7439724B2Oct 21, 2008
On-chip jitter measurement circuit
IBM12 citations83
US7791330B2Sep 7, 2010
On-chip jitter measurement circuit
IBM5 citations62
US8362600B2Jan 29, 2013
Method and structure to reduce soft error rate susceptibility in semiconductor structures
IBM1 citations48