Inventor
YONEZAWA EIJI
JP12 patents
⚠️ This page may combine multiple inventors who share the name “YONEZAWA EIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIDEK KK
9 patentsUS6621568B1Sep 16, 2003
Defect inspecting apparatus
NIDEK KK57 citations95
US6222624B1Apr 24, 2001
Defect inspecting apparatus and method
NIDEK KK73 citations95
US7333650B2Feb 19, 2008
Defect inspection apparatus
NIDEK KK21 citations91
US6928185B2Aug 9, 2005
Defect inspection method and defect inspection apparatus
NIDEK KK33 citations91
US7974699B2Jul 5, 2011
Vision regeneration assisting device
NIDEK KK11 citations83
US6556291B2Apr 29, 2003
Defect inspection method and defect inspection apparatus
NIDEK KK15 citations83
US6801651B2Oct 5, 2004
Visual inspection apparatus
NIDEK KK2 citations61
US6735333B1May 11, 2004
Pattern inspection apparatus
NIDEK KK5 citations61
US7009196B2Mar 7, 2006
Inspection apparatus for inspecting resist removal width
NIDEK KK1 citations47