P

Inventor

HSIA EDWARD

US18 patents
⚠️ This page may combine multiple inventors who share the name “HSIA EDWARD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

14 patents
US6436768B1Aug 20, 2002

Source drain implant during ONO formation for improved isolation of SONOS devices

ADVANCED MICRO DEVICES INC152 citations98
US6967873B2Nov 22, 2005

Memory device and method using positive gate stress to recover overerased cell

ADVANCED MICRO DEVICES INC41 citations92
US6822909B1Nov 23, 2004

Method of controlling program threshold voltage distribution of a dual cell memory device

ADVANCED MICRO DEVICES INC27 citations92
US6778442B1Aug 17, 2004

Method of dual cell memory device operation for improved end-of-life read margin

ADVANCED MICRO DEVICES INC31 citations92
US6775187B1Aug 10, 2004

Method of programming a dual cell memory device

ADVANCED MICRO DEVICES INC29 citations92
US6768673B1Jul 27, 2004

Method of programming and reading a dual cell memory device

ADVANCED MICRO DEVICES INC23 citations90
US5724365AMar 3, 1998

Method of utilizing redundancy testing to substitute for main array programming and AC speed reads

ADVANCED MICRO DEVICES INC17 citations82
US6901010B1May 31, 2005

Erase method for a dual bit memory cell

ADVANCED MICRO DEVICES INC12 citations80
US6956768B2Oct 18, 2005

Method of programming dual cell memory device to store multiple data states per cell

ADVANCED MICRO DEVICES INC7 citations74
US6813752B1Nov 2, 2004

Method of determining charge loss activation energy of a memory array

ADVANCED MICRO DEVICES INC8 citations74
US6771545B1Aug 3, 2004

Method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array

ADVANCED MICRO DEVICES INC10 citations70
US5870407AFeb 9, 1999

Method of screening memory cells at room temperature that would be rejected during hot temperature programming tests

ADVANCED MICRO DEVICES INC11 citations69
US5751633AMay 12, 1998

Method of screening hot temperature erase rejects at room temperature

ADVANCED MICRO DEVICES INC10 citations69
US6381550B1Apr 30, 2002

Method of utilizing fast chip erase to screen endurance rejects

ADVANCED MICRO DEVICES INC11 citations68

ALLERGAN INC

2 patents

FASL LLC

1 patent

LENN JON

1 patent