Inventor
NISHIZAWA MITSUNORI
JP15 patents
Patents
15 patentsUS5591962AJan 7, 1997
Synchronous signal detection apparatus with a photoconductive photodetector
HAMAMATSU PHOTONICS KK38 citations92
US5204522AApr 20, 1993
Method for driving a photoelectric device and a method for driving an image intensifier using the photocathode device
HAMAMATSU PHOTONICS KK7 citations73
US9618563B2Apr 11, 2017
Semiconductor device inspection device and semiconductor device inspection method
HAMAMATSU PHOTONICS KK2 citations72
US9618576B2Apr 11, 2017
Apparatus for testing a semiconductor device and method of testing a semiconductor device
HAMAMATSU PHOTONICS KK3 citations72
US9618550B2Apr 11, 2017
Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target
HAMAMATSU PHOTONICS KK3 citations72
US9562944B2Feb 7, 2017
Semiconductor device inspection device and semiconductor device inspection method
HAMAMATSU PHOTONICS KK3 citations72
US7619199B2Nov 17, 2009
Time-resolved measurement apparatus and position-sensitive election multiplier tube
HAMAMATSU PHOTONICS KK4 citations62
US7425694B2Sep 16, 2008
Time-resolved measurement apparatus
HAMAMATSU PHOTONICS KK5 citations62
US5866897AFeb 2, 1999
Optical waveform detecting device
HAMAMATSU PHOTONICS KK5 citations61
US12320842B2Jun 3, 2025
Inspection device for a semiconductor device
HAMAMATSU PHOTONICS KK0 citations56
US10191104B2Jan 29, 2019
Semiconductor device inspection device and semiconductor device inspection method
HAMAMATSU PHOTONICS KK0 citations51
US10139447B2Nov 27, 2018
Image generation apparatus and image generation method
HAMAMATSU PHOTONICS KK0 citations51
US10101383B2Oct 16, 2018
Semiconductor device inspection device and semiconductor device inspection method
HAMAMATSU PHOTONICS KK0 citations51
US10962932B2Mar 30, 2021
Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement method
HAMAMATSU PHOTONICS KK0 citations44
US10408874B2Sep 10, 2019
Light source device and inspection device
HAMAMATSU PHOTONICS KK0 citations41