Inventor
CHEN YUANNING
US17 patents
⚠️ This page may combine multiple inventors who share the name “CHEN YUANNING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
6 patentsUS7704883B2Apr 27, 2010
Annealing to improve edge roughness in semiconductor technology
TEXAS INSTRUMENTS INC4 citations61
US7569464B2Aug 4, 2009
Method for manufacturing a semiconductor device having improved across chip implant uniformity
TEXAS INSTRUMENTS INC2 citations60
US7033897B2Apr 25, 2006
Encapsulated spacer with low dielectric constant material to reduce the parasitic capacitance between gate and drain in CMOS technology
TEXAS INSTRUMENTS INC5 citations57
US8883541B2Nov 11, 2014
Self-powered integrated circuit with multi-junction photovoltaic cell
TEXAS INSTRUMENTS INC2 citations56
US7667275B2Feb 23, 2010
Using oxynitride spacer to reduce parasitic capacitance in CMOS devices
TEXAS INSTRUMENTS INC0 citations52
US7276408B2Oct 2, 2007
Reduction of dopant loss in a gate structure
TEXAS INSTRUMENTS INC1 citations51
AGERE SYSTEMS INC
5 patentsUS6551946B1Apr 22, 2003
Two-step oxidation process for oxidizing a silicon substrate wherein the first step is carried out at a temperature below the viscoelastic temperature of silicon dioxide and the second step is carried out at a temperature above the viscoelastic temperature
AGERE SYSTEMS INC26 citations92
US7148153B2Dec 12, 2006
Process for oxide fabrication using oxidation steps below and above a threshold temperature
AGERE SYSTEMS INC2 citations62
US6930006B2Aug 16, 2005
Electronic circuit structure with improved dielectric properties
AGERE SYSTEMS INC3 citations59
US7800226B2Sep 21, 2010
Integrated circuit with metal silicide regions
AGERE SYSTEMS INC1 citations46
US7250356B2Jul 31, 2007
Method for forming metal silicide regions in an integrated circuit
AGERE SYSTEMS INC1 citations46
AGERE SYST GUARDIAN CORP
3 patentsUS6541394B1Apr 1, 2003
Method of making a graded grown, high quality oxide layer for a semiconductor device
AGERE SYST GUARDIAN CORP15 citations84
US6492712B1Dec 10, 2002
High quality oxide for use in integrated circuits
AGERE SYST GUARDIAN CORP8 citations73
US6303397B1Oct 16, 2001
Method for benchmarking thin film measurement tools
AGERE SYST GUARDIAN CORP10 citations66