P

Inventor

LIU YAOCHENG

US28 patents
⚠️ This page may combine multiple inventors who share the name “LIU YAOCHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

20 patents
US7696000B2Apr 13, 2010

Low defect Si:C layer with retrograde carbon profile

IBM124 citations98
US7524740B1Apr 28, 2009

Localized strain relaxation for strained Si directly on insulator

IBM70 citations98
US7888197B2Feb 15, 2011

Method of forming stressed SOI FET having doped glass box layer using sacrificial stressed layer

IBM29 citations92
US7279758B1Oct 9, 2007

N-channel MOSFETs comprising dual stressors, and methods for forming the same

IBM24 citations91
US7714358B2May 11, 2010

Semiconductor structure and method of forming the structure

IBM12 citations84
US7709910B2May 4, 2010

Semiconductor structure for low parasitic gate capacitance

IBM8 citations81
US7932144B2Apr 26, 2011

Semiconductor structure and method of forming the structure

IBM4 citations63
US7741658B2Jun 22, 2010

Self-aligned super stressed PFET

IBM3 citations63
US7675118B2Mar 9, 2010

Semiconductor structure with enhanced performance using a simplified dual stress liner configuration

IBM2 citations63
US7632724B2Dec 15, 2009

Stressed SOI FET having tensile and compressive device regions

IBM4 citations63
US7598147B2Oct 6, 2009

Method of forming CMOS with Si:C source/drain by laser melting and recrystallization

IBM5 citations63
US7473608B2Jan 6, 2009

N-channel MOSFETs comprising dual stressors, and methods for forming the same

IBM4 citations61
US7615435B2Nov 10, 2009

Semiconductor device and method of manufacture

IBM4 citations60
US7838932B2Nov 23, 2010

Raised STI structure and superdamascene technique for NMOSFET performance enhancement with embedded silicon carbon

IBM1 citations52
US7667263B2Feb 23, 2010

Semiconductor structure including doped silicon carbon liner layer and method for fabrication thereof

IBM0 citations52
US7655551B2Feb 2, 2010

Control of poly-Si depletion in CMOS via gas phase doping

IBM1 citations52
US7504309B2Mar 17, 2009

Pre-silicide spacer removal

IBM0 citations52
US7485519B2Feb 3, 2009

After gate fabrication of field effect transistor having tensile and compressive regions

IBM1 citations52
US7473594B2Jan 6, 2009

Raised STI structure and superdamascene technique for NMOSFET performance enhancement with embedded silicon carbon

IBM1 citations52
US7473626B2Jan 6, 2009

Control of poly-Si depletion in CMOS via gas phase doping

IBM0 citations52

LIU YAOCHENG

3 patents

HONDA MOTOR CO LTD

2 patents

UNIV STANFORD

2 patents

UNIV LELAND STANFORD JUNIOR

1 patent