Inventor

AHN WOO-JUNG

KR6 patents

⚠️ This page may combine multiple inventors who share the name “AHN WOO-JUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PAHK HEUI JAE

2 patents

US6005669ADec 21, 1999

Non contact measuring method for three dimensional micro pattern in measuring object

PAHK HEUI JAE27 citations90

US8947673B2Feb 3, 2015

Estimating thickness based on number of peaks between two peaks in scanning white light interferometry

PAHK HEUI JAE1 citations45

PAHK HEUI-JAE

2 patents

US8199332B2Jun 12, 2012

Apparatus for measuring thickness

PAHK HEUI-JAE3 citations60

US8279447B2Oct 2, 2012

Method for measuring thickness

PAHK HEUI-JAE3 citations59

AHN WOO JUNG

1 patent

US8116555B2Feb 14, 2012

Vision inspection system and method for inspecting workpiece using the same

AHN WOO JUNG0 citations43

SHIN HEUNG HYUN

1 patent

US8416293B2Apr 9, 2013

Plasma monitoring device and method

SHIN HEUNG HYUN0 citations38