Inventor
KING PAUL L
US34 patents
⚠️ This page may combine multiple inventors who share the name “KING PAUL L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
30 patentsUS6465334B1Oct 15, 2002
Enhanced electroless deposition of dielectric precursor materials for use in in-laid gate MOS transistors
ADVANCED MICRO DEVICES INC154 citations99
US6562718B1May 13, 2003
Process for forming fully silicided gates
ADVANCED MICRO DEVICES INC107 citations98
US6475874B2Nov 5, 2002
Damascene NiSi metal gate high-k transistor
ADVANCED MICRO DEVICES INC137 citations98
US6300203B1Oct 9, 2001
Electrolytic deposition of dielectric precursor materials for use in in-laid gate MOS transistors
ADVANCED MICRO DEVICES INC101 citations98
US6630741B1Oct 7, 2003
Method of reducing electromigration by ordering zinc-doping in an electroplated copper-zinc interconnect and a semiconductor device thereby formed
ADVANCED MICRO DEVICES INC58 citations96
US6465309B1Oct 15, 2002
Silicide gate transistors
ADVANCED MICRO DEVICES INC57 citations96
US6611576B1Aug 26, 2003
Automated control of metal thickness during film deposition
ADVANCED MICRO DEVICES INC19 citations93
US6717236B1Apr 6, 2004
Method of reducing electromigration by forming an electroplated copper-zinc interconnect and a semiconductor device thereby formed
ADVANCED MICRO DEVICES INC22 citations92
US6602781B1Aug 5, 2003
Metal silicide gate transistors
ADVANCED MICRO DEVICES INC52 citations92
US6380057B1Apr 30, 2002
Enhancement of nickel silicide formation by use of nickel pre-amorphizing implant
ADVANCED MICRO DEVICES INC34 citations92
US6368950B1Apr 9, 2002
Silicide gate transistors
ADVANCED MICRO DEVICES INC41 citations92
US6342414B1Jan 29, 2002
Damascene NiSi metal gate high-k transistor
ADVANCED MICRO DEVICES INC24 citations92
US6559051B1May 6, 2003
Electroless deposition of dielectric precursor materials for use in in-laid gate MOS transistors
ADVANCED MICRO DEVICES INC33 citations90
US6297107B1Oct 2, 2001
High dielectric constant materials as gate dielectrics
ADVANCED MICRO DEVICES INC52 citations90
US7755194B1Jul 13, 2010
Composite barrier layers with controlled copper interface surface roughness
ADVANCED MICRO DEVICES INC10 citations84
US7033940B1Apr 25, 2006
Method of forming composite barrier layers with controlled copper interface surface roughness
ADVANCED MICRO DEVICES INC13 citations84
US6610181B1Aug 26, 2003
Method of controlling the formation of metal layers
ADVANCED MICRO DEVICES INC18 citations84
US6372644B1Apr 16, 2002
Hydrogen passivated silicon nitride spacers for reduced nickel silicide bridging
ADVANCED MICRO DEVICES INC16 citations84
US7064067B1Jun 20, 2006
Reduction of lateral silicide growth in integrated circuit technology
ADVANCED MICRO DEVICES INC11 citations83
US6605513B2Aug 12, 2003
Method of forming nickel silicide using a one-step rapid thermal anneal process and backend processing
ADVANCED MICRO DEVICES INC16 citations83
US7015076B1Mar 21, 2006
Selectable open circuit and anti-fuse element, and fabrication method therefor
ADVANCED MICRO DEVICES INC10 citations74
US6469387B1Oct 22, 2002
Semiconductor device formed by calcium doping a copper surface using a chemical solution
ADVANCED MICRO DEVICES INC11 citations74
US6444580B1Sep 3, 2002
Method of reducing carbon, sulphur, and oxygen impurities in a calcium-doped copper surface and semiconductor device thereby formed
ADVANCED MICRO DEVICES INC6 citations74
US6784506B2Aug 31, 2004
Silicide process using high K-dielectrics
ADVANCED MICRO DEVICES INC10 citations73
US6624074B1Sep 23, 2003
Method of fabricating a semiconductor device by calcium doping a copper surface using a chemical solution
ADVANCED MICRO DEVICES INC5 citations63
US7005357B2Feb 28, 2006
Low stress sidewall spacer in integrated circuit technology
ADVANCED MICRO DEVICES INC2 citations62
US6764912B1Jul 20, 2004
Passivation of nitride spacer
ADVANCED MICRO DEVICES INC6 citations62
US6458679B1Oct 1, 2002
Method of making silicide stop layer in a damascene semiconductor structure
ADVANCED MICRO DEVICES INC5 citations62
US7151020B1Dec 19, 2006
Conversion of transition metal to silicide through back end processing in integrated circuit technology
ADVANCED MICRO DEVICES INC2 citations61
US7250667B2Jul 31, 2007
Selectable open circuit and anti-fuse element
ADVANCED MICRO DEVICES INC0 citations52