Inventor

SONG PEILIN

US86 patents

⚠️ This page may combine multiple inventors who share the name “SONG PEILIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SONG PEILIN

IBM

AC scan diagnostic method

Physical unclonable function generation and management

Scan structure for improving transition fault coverage and scan diagnostics

On-chip detection of power supply vulnerabilities

On-chip power supply noise detector

VLSI chip test power reduction

Global transition scan based AC method

Method and apparatus for improving transition fault testability of semiconductor chips

Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis

Stuck-at fault scan chain diagnostic method

Physical unclonable function generation and management

System and method for virtual control of laboratory equipment

Enhanced signal observability for circuit analysis

Method for the characterization and monitoring of integrated circuits

On-chip detection of power supply vulnerabilities

Measuring and predicting VLSI chip reliability and failure

On-chip power supply noise detector

System and method for estimation of integrated circuit signal characteristics using optical measurements

Method and system for providing interactive testing of integrated circuits

Process variation on-chip sensor

Machine learning-based circuit board inspection

Tamper-resistant circuit, back-end of the line memory and physical unclonable function for supply chain protection

RRAM filament location based on NIR emission

Automated scan chain diagnostics using emission

Automated scan chain diagnostics using emission

Integrated time dependent dielectric breakdown reliability testing

On-chip detection of power supply vulnerabilities

Method and apparatus for diagnosing broken scan chain based on leakage light emission

Method and apparatus for diagnosing broken scan chain based on leakage light emission

Integrated circuit identification

Integrated circuit identification

Method for the characterization and monitoring of integrated circuits

Method for the characterization and monitoring of integrated circuits

Programmable jitter signal generator

Detection of hardware trojan using light emissions with sacrificial mask

Non-destructive analysis to determine use history of processor

Automated scan chain diagnostics using emission

Method and system for quickly identifying circuit components in an emission image

Enhanced signal observability for circuit analysis

Method and structure for picosecond-imaging-circuit-analysis based built-in-self-test diagnostic

STELLARI FRANCO

Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system

Navigating analytical tools using layout software

Creating emission images of integrated circuits

Navigating analytical tools using layout software

BRULEY JOHN

Reliable physical unclonable function for device authentication

CADENCE DESIGN SYSTEMS INC

Random path delay testing methodology

GLOBALFOUNDRIES US 2 LLC

Physical unclonable function generation and management

POLONSKY STANISLAV

Constructing variability maps by correlating off-state leakage emission images to layout information

BERNSTEIN KERRY

Detecting chip alterations with light emission

SONG PEILIN

Method and system for quickly identifying circuit components in an emission image