Inventor
BOYETTE JR JAMES E
US6 patents
Patents
6 patentsUS5543726AAug 6, 1996
Open frame gantry probing system
IBM32 citations91
US5467020ANov 14, 1995
Testing fixture and method for circuit traces on a flexible substrate
IBM33 citations91
US5550483AAug 27, 1996
High speed test probe positioning system
IBM19 citations81
US5635849AJun 3, 1997
Miniature probe positioning actuator
IBM10 citations71
US5598104AJan 28, 1997
Breakaway test probe actuator used in a probing apparatus
IBM15 citations71
US5532611AJul 2, 1996
Miniature probe positioning actuator
IBM11 citations71