Inventor · disambiguated record
Cory Watkins
Also filed as: WATKINS CORY · WATKINS CORY M
19 granted patents·14 pending applications·265 citations·filing 2000–2016
95Inventor score
Files withAUGUST TECHNOLOGY CORP13RUDOLPH TECHNOLOGIES INC7WATKINS CORY2HARLESS MARK1O'DELL JEFFREY1
Top patents by PatentIndex Score
33 records- 0193US6826298B1Automated wafer defect inspection system and a process of performing such inspectionAUGUST TECHNOLOGY CORP·Filed 2000·Granted Nov 30, 2004·53 cites·5 claims
- 0292US9464992B2Automated wafer defect inspection system and a process of performing such inspectionRUDOLPH TECH INC·Filed 2016·Granted Oct 11, 2016·6 cites·11 claims
- 0392US7729528B2Automated wafer defect inspection system and a process of performing such inspectionRUDOLPH TECHNOLOGIES INC·Filed 2004·Granted Jun 1, 2010·43 cites·53 claims
- 0485US6731383B2Confocal 3D inspection system and processAUGUST TECHNOLOGY CORP·Filed 2001·Granted May 4, 2004·28 cites·19 claims
- 0582US7196300B2Dynamic focusing method and apparatusRUDOLPH TECHNOLOGIES INC·Filed 2005·Granted Mar 27, 2007·9 cites·26 claims
- 0679US6773935B2Confocal 3D inspection system and processAUGUST TECHNOLOGY CORP·Filed 2002·Granted Aug 10, 2004·19 cites·10 claims
- 0777US7822260B2Edge inspectionRUDOLPH TECHNOLOGIES INC·Filed 2008·Granted Oct 26, 2010·5 cites·3 claims
- 0877US7340087B2Edge inspectionRUDOLPH TECHNOLOGIES INC·Filed 2004·Granted Mar 4, 2008·14 cites·36 claims
- 0975US7703823B2Wafer holding mechanismRUDOLPH TECHNOLOGIES INC·Filed 2005·Granted Apr 27, 2010·5 cites·27 claims
- 1074US6970287B1Confocal 3D inspection system and processAUGUST TECHNOLOGY CORP·Filed 2002·Granted Nov 29, 2005·14 cites·12 claims
- 1173US8045788B2Product setup sharing for multiple inspection systemsAUGUST TECHNOLOGY CORP·Filed 2004·Granted Oct 25, 2011·21 cites·4 claims
- 1272US6882415B1Confocal 3D inspection system and processAUGUST TECHNOLOGY CORP·Filed 2002·Granted Apr 19, 2005·16 cites·19 claims
- 1371US6870609B2Confocal 3D inspection system and processAUGUST TECHNOLOGY CORP·Filed 2002·Granted Mar 22, 2005·17 cites·6 claims
- 1468US8130372B2Wafer holding mechanismHARLESS MARK·Filed 2010·Granted Mar 6, 2012·3 cites·1 claims
- 1564US9337071B2Automated wafer defect inspection system and a process of performing such inspectionO'DELL JEFFREY L·Filed 2010·Granted May 10, 2016·1 cites·44 claims
- 1664US7589783B2Camera and illumination matching for inspection systemRUDOLPH TECHNOLOGIES INC·Filed 2004·Granted Sep 15, 2009·6 cites·13 claims
- 1763US7813638B2System for generating camera triggersRUDOLPH TECHNOLOGIES INC·Filed 2005·Granted Oct 12, 2010·2 cites·21 claims
- 1853US2012087569A1Automated wafer defect inspection system and a process of performing such inspectionO'DELL JEFFREY·Filed 2011·Application pending·0 cites
- 1947US7111095B2Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual laneAUGUST TECHNOLOGY CORP·Filed 2003·Granted Sep 19, 2006·2 cites·14 claims
- 2046US7321108B2Dynamic focusing method and apparatusRUDOLPH TECHNOLOGY INC·Filed 2007·Granted Jan 22, 2008·1 cites·21 claims
- 2146US2004096095A1Inspection tool with partial framing/windowing cameraAUGUST TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 2245US2003221041A1Sensor with switched fabric interfaceAUGUST TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 2343US2005052197A1Multi-tool managerFiled 2004·Application pending·0 cites
- 2443US2005038554A1Inspection and metrology module cluster toolFiled 2004·Application pending·0 cites
- 2542US2004102043A1Confocal 3D inspection system and processAUGUST TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 2642US2009161094A1Wafer bevel inspection mechanismWATKINS CORY M·Filed 2007·Application pending·0 cites
- 2741US2002148984A1Confocal 3D inspection system and processFiled 2002·Application pending·0 cites
- 2841US2006023229A1Camera module for an optical inspection system and related method of useWATKINS CORY·Filed 2005·Application pending·0 cites
- 2940US2007158535A1Color imaging using monochrome imagersWATKINS CORY·Filed 2007·Application pending·0 cites
- 3038US2004109600A1Inspection tool with partial framing camreaFiled 2003·Application pending·0 cites
- 3138US2004179096A1Imaging system using theta-theta coordinate stage and continuous image rotation to compensate for stage rotationAUGUST TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 3237US2002145734A1Confocal 3D inspection system and processFiled 2002·Application pending·0 cites
- 3333US2003220997A1Switched fabric based inspection systemAUGUST TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →