Inventor
FUHRMANN DIRK
DE15 patents
⚠️ This page may combine multiple inventors who share the name “FUHRMANN DIRK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
13 patentsUS7313044B2Dec 25, 2007
Integrated semiconductor memory with temperature-dependent voltage generation
INFINEON TECHNOLOGIES AG24 citations91
US7330387B2Feb 12, 2008
Integrated semiconductor memory device
INFINEON TECHNOLOGIES AG13 citations82
US6882556B2Apr 19, 2005
Semiconductor memory having a configuration of memory cells
INFINEON TECHNOLOGIES AG12 citations82
US7299388B2Nov 20, 2007
Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor wafer
INFINEON TECHNOLOGIES AG7 citations72
US7082513B2Jul 25, 2006
Integrated memory and method for checking the functioning of an integrated memory
INFINEON TECHNOLOGIES AG6 citations62
US7057224B2Jun 6, 2006
Semiconductor memory having an arrangement of memory cells
INFINEON TECHNOLOGIES AG4 citations61
US6963514B2Nov 8, 2005
Method for testing an integrated semiconductor memory, and integrated semiconductor memory
INFINEON TECHNOLOGIES AG2 citations61
US7457177B2Nov 25, 2008
Random access memory including circuit to compress comparison results
INFINEON TECHNOLOGIES AG5 citations60
US7362632B2Apr 22, 2008
Test parallelism increase by tester controllable switching of chip select groups
INFINEON TECHNOLOGIES AG2 citations60
US7313033B2Dec 25, 2007
Random access memory including first and second voltage sources
INFINEON TECHNOLOGIES AG4 citations60
US7443740B2Oct 28, 2008
Integrated semiconductor memory with adjustable internal voltage
INFINEON TECHNOLOGIES AG2 citations53
US7136295B2Nov 14, 2006
Semiconductor arrangement
INFINEON TECHNOLOGIES AG0 citations51
US7197679B2Mar 27, 2007
Method for testing an integrated semiconductor memory with a shortened reading time
INFINEON TECHNOLOGIES AG0 citations40