Inventor
OBREMSKI THOMAS E
US5 patents
Patents
5 patentsUS7073100B2Jul 4, 2006
Method for testing embedded DRAM arrays
IBM16 citations90
US6452848B1Sep 17, 2002
Programmable built-in self test (BIST) data generator for semiconductor memory devices
IBM29 citations90
US6388930B1May 14, 2002
Method and apparatus for ram built-in self test (BIST) address generation using bit-wise masking of counters
IBM20 citations89
US7103814B2Sep 5, 2006
Testing logic and embedded memory in parallel
IBM16 citations81
US7237165B2Jun 26, 2007
Method for testing embedded DRAM arrays
IBM9 citations71