Inventor
NAKAZAWA EIKO
JP20 patents
⚠️ This page may combine multiple inventors who share the name “NAKAZAWA EIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
11 patentsUS7214938B2May 8, 2007
Sample observation method and transmission electron microscope
HITACHI HIGH TECH CORP4 citations62
US6982420B2Jan 3, 2006
Sample observation method and transmission electron microscope
HITACHI HIGH TECH CORP2 citations62
US7838829B2Nov 23, 2010
Charged particle beam device
HITACHI HIGH TECH CORP2 citations61
US11221280B2Jan 11, 2022
Method of preparing biological tissue sample and method of observing biological tissue section sample
HITACHI HIGH TECH CORP0 citations60
US9129772B2Sep 8, 2015
Transmission electron microscope, and method of observing specimen
HITACHI HIGH TECH CORP0 citations52
US7573030B2Aug 11, 2009
Specimen observation method
HITACHI HIGH TECH CORP0 citations52
US10852253B2Dec 1, 2020
Specimen observation method
HITACHI HIGH TECH CORP0 citations51
US9202668B2Dec 1, 2015
Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen
HITACHI HIGH TECH CORP0 citations51
US7705305B2Apr 27, 2010
Sample observation method and transmission electron microscope
HITACHI HIGH TECH CORP0 citations51
US10808312B2Oct 20, 2020
Charged particle device and wiring method
HITACHI HIGH TECH CORP0 citations50
US9963776B2May 8, 2018
Charged particle device and wiring method
HITACHI HIGH TECH CORP0 citations50