Inventor
NAGAOKI ISAO
JP23 patents
⚠️ This page may combine multiple inventors who share the name “NAGAOKI ISAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
9 patentsUS6570156B1May 27, 2003
Autoadjusting electron microscope
HITACHI LTD100 citations98
US6888139B2May 3, 2005
Electron microscope
HITACHI LTD28 citations92
US7544936B2Jun 9, 2009
Method and device for observing a specimen in a field of view of an electron microscope
HITACHI LTD4 citations73
US7164129B2Jan 16, 2007
Method and device for observing a specimen in a field of view of an electron microscope
HITACHI LTD4 citations73
US7022989B2Apr 4, 2006
Method and device for observing a specimen in a field of view of an electron microscope
HITACHI LTD10 citations73
US7012254B2Mar 14, 2006
Method and device for observing a specimen in a field of view of an electron microscope
HITACHI LTD4 citations73
US6878934B2Apr 12, 2005
Method and device for observing a specimen in a field of view of an electron
HITACHI LTD8 citations73
US6875983B2Apr 5, 2005
Electron microscope and means to set observation conditions
HITACHI LTD7 citations73
US6472663B2Oct 29, 2002
Electron microscope
HITACHI LTD6 citations61
HITACHI HIGH TECH CORP
9 patentsUSD636005SApr 12, 2011
Electron microscope
HITACHI HIGH TECH CORP11 citations84
US9721752B2Aug 1, 2017
Sample holder and charged particle device
HITACHI HIGH TECH CORP3 citations73
US10083814B2Sep 25, 2018
Electron microscope and sample observation method
HITACHI HIGH TECH CORP2 citations71
US6777679B2Aug 17, 2004
Method of observing a sample by a transmission electron microscope
HITACHI HIGH TECH CORP10 citations69
US7214938B2May 8, 2007
Sample observation method and transmission electron microscope
HITACHI HIGH TECH CORP4 citations62
US6982420B2Jan 3, 2006
Sample observation method and transmission electron microscope
HITACHI HIGH TECH CORP2 citations62
US7838829B2Nov 23, 2010
Charged particle beam device
HITACHI HIGH TECH CORP2 citations61
US7838834B2Nov 23, 2010
Image forming method and electron microscope
HITACHI HIGH TECH CORP0 citations52
US8044352B2Oct 25, 2011
Electron microscopy
HITACHI HIGH TECH CORP1 citations51