Inventor
HAITJEMA HAN
NL4 patents
Patents
4 patentsUS9568304B2Feb 14, 2017
Image sequence and evaluation method and system for structured illumination microscopy
MITUTOYO CORP8 citations77
US10458779B2Oct 29, 2019
Method and apparatus for inner diameter measurement of transparent tube
MITUTOYO CORP3 citations63
US9103651B2Aug 11, 2015
Method and apparatus for determining a property of a surface
MITUTOYO CORP3 citations59
US10024648B2Jul 17, 2018
Interference measuring device and method of measurement using the same device
MITUTOYO CORP0 citations49