Inventor

SHIBANO KAZUHIRO

JP4 patents

⚠️ This page may combine multiple inventors who share the name “SHIBANO KAZUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

1 patent

US6288955B1Sep 11, 2001

Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysis

SAMSUNG ELECTRONICS CO LTD16 citations80

ADVANTEST CORP

1 patent

US11902813B2Feb 13, 2024

Measurement result receiving apparatus, measuring apparatus, and method, program, and recording medium for the same

ADVANTEST CORP0 citations60

TOSHIBA KK

1 patent

US6034905AMar 7, 2000

Apparatus for testing semiconductor memory device

TOSHIBA KK6 citations60

DOI MASARU

1 patent

US8601329B2Dec 3, 2013

Test apparatus and test method

DOI MASARU0 citations31