Inventor
HANSEN PATRICK R
US13 patents
Patents
13 patentsUS6731179B2May 4, 2004
System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)
IBM96 citations96
US6163862ADec 19, 2000
On-chip test circuit for evaluating an on-chip signal using an external test signal
IBM459 citations96
US6133749AOct 17, 2000
Variable impedance output driver circuit using analog biases to match driver output impedance to load input impedance
IBM68 citations96
US6509778B2Jan 21, 2003
BIST circuit for variable impedance system
IBM43 citations92
US6501293B2Dec 31, 2002
Method and apparatus for programmable active termination of input/output devices
IBM27 citations92
US6140885AOct 31, 2000
On-chip automatic system for impedance matching in very high speed input-output chip interfacing
IBM24 citations92
US6278339B2Aug 21, 2001
Termination resistance independent system for impedance matching in high speed input-output chip interfacing
IBM9 citations74
US6249193B1Jun 19, 2001
Termination impedance independent system for impedance matching in high speed input-output chip interfacing
IBM7 citations74
US6542418B2Apr 1, 2003
Redundant memory array having dual-use repair elements
IBM10 citations73
US6617986B2Sep 9, 2003
Area efficient, sequential gray code to thermometer code decoder
IBM7 citations69
US6441646B1Aug 27, 2002
Structure and method of alternating precharge in dynamic SOI circuits
IBM6 citations62
US6181155B1Jan 30, 2001
Method and apparatus for testing dynamic logic using an improved reset pulse
IBM1 citations51
US6269461B1Jul 31, 2001
Testing method for dynamic logic keeper device
IBM0 citations45