P

Inventor

COLBURN MATTHEW E

US158 patents
⚠️ This page may combine multiple inventors who share the name “COLBURN MATTHEW E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

29 patents
US7037744B2May 2, 2006

Method for fabricating a self-aligned nanocolumnar airbridge and structure produced thereby

IBM84 citations98
US7030495B2Apr 18, 2006

Method for fabricating a self-aligned nanocolumnar airbridge and structure produced thereby

IBM64 citations98
US6911400B2Jun 28, 2005

Nonlithographic method to produce self-aligned mask, articles produced by same and compositions for same

IBM79 citations98
US8853085B1Oct 7, 2014

Grapho-epitaxy DSA process with dimension control of template pattern

IBM47 citations97
US7361991B2Apr 22, 2008

Closed air gap interconnect structure

IBM67 citations97
US7405147B2Jul 29, 2008

Device and methodology for reducing effective dielectric constant in semiconductor devices

IBM35 citations96
US7179758B2Feb 20, 2007

Recovery of hydrophobicity of low-k and ultra low-k organosilicate films used as inter metal dielectrics

IBM50 citations96
US6641899B1Nov 4, 2003

Nonlithographic method to produce masks by selective reaction, articles produced, and composition for same

IBM43 citations96
US9934970B1Apr 3, 2018

Self aligned pattern formation post spacer etchback in tight pitch configurations

IBM22 citations94
US9991156B2Jun 5, 2018

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

IBM15 citations93
US9305845B2Apr 5, 2016

Self-aligned quadruple patterning process

IBM17 citations93
US7892940B2Feb 22, 2011

Device and methodology for reducing effective dielectric constant in semiconductor devices

IBM11 citations93
US7838873B2Nov 23, 2010

Structure for stochastic integrated circuit personalization

IBM17 citations93
US7790350B2Sep 7, 2010

Method and materials for patterning a neutral surface

IBM38 citations93
US7071097B2Jul 4, 2006

Method for improved process latitude by elongated via integration

IBM21 citations93
US6930034B2Aug 16, 2005

Robust ultra-low k interconnect structures using bridge-then-metallization fabrication sequence

IBM43 citations93
US7883832B2Feb 8, 2011

Method and apparatus for direct referencing of top surface of workpiece during imprint lithography

IBM42 citations92
US7862982B2Jan 4, 2011

Chemical trim of photoresist lines by means of a tuned overcoat material

IBM21 citations92
US7435074B2Oct 14, 2008

Method for fabricating dual damascence structures using photo-imprint lithography, methods for fabricating imprint lithography molds for dual damascene structures, materials for imprintable dielectrics and equipment for photo-imprint lithography used in dual damascence patterning

IBM13 citations92
US7393776B2Jul 1, 2008

Method of forming closed air gap interconnects and structures formed thereby

IBM26 citations92
US7309649B2Dec 18, 2007

Method of forming closed air gap interconnects and structures formed thereby

IBM33 citations92
US8859433B2Oct 14, 2014

DSA grapho-epitaxy process with etch stop material

IBM21 citations91
US7514361B2Apr 7, 2009

Selective thin metal cap process

IBM28 citations91
US7268432B2Sep 11, 2007

Interconnect structures with engineered dielectrics with nanocolumnar porosity

IBM17 citations91
US10529569B2Jan 7, 2020

Self aligned pattern formation post spacer etchback in tight pitch configurations

IBM5 citations84
US9779944B1Oct 3, 2017

Method and structure for cut material selection

IBM17 citations84
US9607886B1Mar 28, 2017

Self aligned conductive lines with relaxed overlay

IBM6 citations84
US9087792B2Jul 21, 2015

Integration of dense and variable pitch fin structures

IBM9 citations84
US9040371B2May 26, 2015

Integration of dense and variable pitch fin structures

IBM12 citations84

FACEBOOK TECH LLC

10 patents

UNIV TEXAS

3 patents

ARNOLD JOHN C

3 patents

META PLATFORMS TECH LLC

2 patents

EDELSTEIN DANIEL C

1 patent

YIN YUNPENG

1 patent

CHENG JOY

1 patent

Showing the top 50 of 158 patents by PatentIndex Score.