Inventor

OGISO YOSHIAKI

JP10 patents

⚠️ This page may combine multiple inventors who share the name “OGISO YOSHIAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJITSU LTD

2 patents

US5999005ADec 7, 1999

Voltage and displacement measuring apparatus and probe

FUJITSU LTD18 citations92

US5677635AOct 14, 1997

Voltage and displacement measuring apparatus and probe

FUJITSU LTD10 citations73

OGISO YOSHIAKI

2 patents

US8779359B2Jul 15, 2014

Defect review apparatus and defect review method

OGISO YOSHIAKI6 citations65

US8675948B2Mar 18, 2014

Mask inspection apparatus and mask inspection method

OGISO YOSHIAKI0 citations37

ADVANTEST CORP

2 patents

US8507858B2Aug 13, 2013

Pattern measurement apparatus and pattern measurement method

ADVANTEST CORP1 citations50

US6546154B2Apr 8, 2003

Image detection method and length measurement apparatus

ADVANTEST CORP0 citations41

MURAKAWA TSUTOMU

2 patents

US8071943B2Dec 6, 2011

Mask inspection apparatus and image creation method

MURAKAWA TSUTOMU1 citations50

US8559697B2Oct 15, 2013

Mask inspection apparatus and image generation method

MURAKAWA TSUTOMU1 citations49

MATSUMOTO JUN

1 patent

US8431895B2Apr 30, 2013

Pattern measuring apparatus and pattern measuring method

MATSUMOTO JUN2 citations61

OGINO RYUICHI

1 patent

US8809778B2Aug 19, 2014

Pattern inspection apparatus and method

OGINO RYUICHI3 citations49