Inventor
PURI MUKESH K
US9 patents
⚠️ This page may combine multiple inventors who share the name “PURI MUKESH K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LSI LOGIC CORP
5 patentsUS7076699B1Jul 11, 2006
Method for testing semiconductor devices having built-in self repair (BISR) memory
LSI LOGIC CORP26 citations92
US6898143B2May 24, 2005
Sharing fuse blocks between memories in hard-BISR
LSI LOGIC CORP19 citations92
US6871297B2Mar 22, 2005
Power-on state machine implementation with a counter to control the scan for products with hard-BISR memories
LSI LOGIC CORP28 citations92
US6928598B1Aug 9, 2005
Scan method for built-in-self-repair (BISR)
LSI LOGIC CORP14 citations83
US7185243B1Feb 27, 2007
Testing implementation suitable for built-in self-repair (BISR) memories
LSI LOGIC CORP7 citations72
LSI CORP
3 patentsUS7260758B1Aug 21, 2007
Method and system for performing built-in self-test routines using an accumulator to store fault information
LSI CORP73 citations97
US7493541B1Feb 17, 2009
Method and system for performing built-in-self-test routines using an accumulator to store fault information
LSI CORP20 citations92
US7913125B2Mar 22, 2011
BISR mode to test the redundant elements and regular functional memory to avoid test escapes
LSI CORP3 citations62