Inventor
SCHWARZ WILLIAM
US12 patents
⚠️ This page may combine multiple inventors who share the name “SCHWARZ WILLIAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LSI LOGIC CORP
7 patentsUS5909404AJun 1, 1999
Refresh sampling built-in self test and repair circuit
LSI LOGIC CORP95 citations97
US6255836B1Jul 3, 2001
Built-in self-test unit having a reconfigurable data retention test
LSI LOGIC CORP52 citations96
US6505313B1Jan 7, 2003
Multi-condition BISR test mode for memories with redundancy
LSI LOGIC CORP60 citations95
US7076699B1Jul 11, 2006
Method for testing semiconductor devices having built-in self repair (BISR) memory
LSI LOGIC CORP26 citations92
US5982681ANov 9, 1999
Reconfigurable built-in self test circuit
LSI LOGIC CORP53 citations92
US5835429ANov 10, 1998
Data retention weak write circuit and method of using same
LSI LOGIC CORP35 citations92
US6505308B1Jan 7, 2003
Fast built-in self-repair circuit
LSI LOGIC CORP18 citations83
AMERICAN EXPRESS TRAVEL RELATE
2 patentsLSI CORP
2 patentsUS7260758B1Aug 21, 2007
Method and system for performing built-in self-test routines using an accumulator to store fault information
LSI CORP73 citations97
US7493541B1Feb 17, 2009
Method and system for performing built-in-self-test routines using an accumulator to store fault information
LSI CORP20 citations92