Inventor

TAKADA SATOSHI

JP35 patents

⚠️ This page may combine multiple inventors who share the name “TAKADA SATOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAKADA SATOSHI

HITACHI HIGH TECH CORP

Electron microscope

Charged particle beam apparatus

Charged particle beam device

Defect classification device and defect classification program

Charged particle beam device and sample observation method

Semiconductor inspection device and method for inspecting semiconductor sample

Charged particle beam apparatus

Charged particle beam apparatus

Computer system of observation device and processing method

Inspection method

Method for pattern measurement, method for setting device parameters of charged particle radiation device, and charged particle radiation device

FUJI XEROX CO LTD

Drawer member having image fixing unit, and image forming apparatus having same

Image forming apparatus with internal airflow

Gas purification device and image forming apparatus

Particle collecting device and image forming apparatus

Image forming apparatus

Removal mechanism and image forming apparatus

Cleaning device, device to be cleaned, cleaning member, and image forming apparatus

HONDA MOTOR CO LTD

Battery pack

Vehicle battery device

Vehicle battery device

Vehicle battery device

Battery device and method for manufacturing battery device

Battery device including battery cell group configured by a plurality of laminated battery cells in outer packaging and method for manufacturing the battery device

YOKOGAWA ELECTRIC CORP

Regeneration type body fluid treating circuit and method for treating body fluid

Regeneration type body fluid treating circuit and method for treating body fluid

SONY CORP

Apparatus, method, and program for controlling display for continuous image capturing

Continuous image capturing based on detection of a specific state

DENSO CORP

Power conversion device

Unbalance measuring apparatus

HIRAI AKIRA

Imaging apparatus, method of controlling imaging apparatus, and program for continuous image capturing

TAKADA SATOSHI

Scanning electron microscope and sample observation method

ISHIDA SEISAKUSHO

Weighing device having gates for casting article onto center area of dispersal table, and method of driving gates of weighing device

SONY GROUP CORP

Imaging device and imaging control method

KATOU TATSUICHI

Charged particle beam apparatus